A simple atomic force microscope-based method for quantifying wear of sliding probes
Flater, Erin E, Barnes, Jared D, Hitz Graff, Jesse A, Weaver, Jayse M, Ansari, Naveed, Poda, Aimee R, Robert Ashurst, W, Khanal, Subarna R, Jacobs, Tevis D B
Published in Review of scientific instruments (01.11.2018)
Published in Review of scientific instruments (01.11.2018)
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