Using far-infrared two-photon excitation to measure the resonant-polaron effect in the Reststrahlen band of GaAs:Si
Planken, P.C.M., Pellemans, H.P.M., van Son, P.C., Hovenier, J.N., Klaassen, T.O., Wenckebach, W.Th, Barmby, P.W., Dunn, J.L., Bates, C.A., Foxon, C.T., Langerak, C.J.G.M.
Published in Optics communications (01.03.1996)
Published in Optics communications (01.03.1996)
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