by Bardell, P.H.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.1992)

by Bardell, P.H.
Published in Proceedings. International Test Conference 1990 (1990)

by Bardell, P.H.
Published in Proceedings. 'Meeting the Tests of Time'., International Test Conference (1989)

by P.H. BARDELL
Year of Publication 16.11.1971

by Savir, J., Bardell, P.H.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.1991)

by Wilfinger, R.J., Bardell, P.H.
Published in 1966 International Electron Devices Meeting (1966)

by Bardell, P.H., Lapointe, M.J.
Published in 1991, Proceedings. International Test Conference (1991)

by Wilfinger, R.J., Chhabra, D.S., Bardell, P.H.
Published in IEEE transactions on electron devices (01.08.1966)

by Bardell, P.H., McAnney, W.H.
Published in IEEE design & test of computers (01.08.1988)

by Wilfinger, R.J., Chhabra, D.S., Bardell, P.H.
Published in Proceedings of the IEEE (01.01.1966)