Thermally activated processes in the buried oxide of SIMOX SOI structures and devices
Lysenko, V.S, Nazarov, A.N, Kilchytska, V.I, Osiyuk, I.N, Tyagulski, I.P, Gomeniuk, Yu.V, Barchuk, I.P
Published in Solid-state electronics (01.05.2001)
Published in Solid-state electronics (01.05.2001)
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Journal Article
Electrical properties and radiation hardness of SOI systems with multilayer buried dielectric
Barchuk, I.P., Kilchitskaya, V.I., Lysenko, V.S., Nazarov, A.N., Rudenko, T.E., Djurenko, S.V., Rudenko, A.N., Yurchenko, A.P., Ballutaud, D.B., Colinge, J.-P.
Published in IEEE transactions on nuclear science (01.12.1997)
Published in IEEE transactions on nuclear science (01.12.1997)
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Journal Article
Association of high-temperature kink-effect in SIMOX SOI fully depleted n-MOSFET with bias temperature instability of buried oxide
Nazarov, A.N., Barchuk, I.P., Lysenko, V.S., Colinge, J.-P.
Published in Microelectronic engineering (1999)
Published in Microelectronic engineering (1999)
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Conference Proceeding
Method and model of a substantiation of measures on increase of a production efficiency in branch of the agricultural enterprise
Kovel, P.V, Garbuzova, E.P, Barchuk, I.P.,Belarus State Academy of Agriculture, Gorki (Belarus)
Published in Вестник Белорусской государственной сельскохозяйственной академии (Belarus). Bulletin of the Belarus State Agricultural Academy (2007)
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Published in Вестник Белорусской государственной сельскохозяйственной академии (Belarus). Bulletin of the Belarus State Agricultural Academy (2007)
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