Investigation of ion energy distribution functions in EUV-induced plasmas by ion mass spectrometry
van de Ven, Tijn H. M., Reefman, Pim, Osorio, Edgar A., Banine, Vadim Y., Beckers, Job
Published in 2016 IEEE International Conference on Plasma Science (ICOPS) (01.06.2016)
Published in 2016 IEEE International Conference on Plasma Science (ICOPS) (01.06.2016)
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Conference Proceeding
RADIATION SOURCE FOR USE IN LITHOGRAPHIC PROJECTION APPARATUS
BARTNIK ANDRZEJ, FIEDOROWICZ HENRYK, BANINE VADIM Y, KOSHELEV KONSTANTIN NICOLLAEBICHI, BIJKERK FREDERIK, DE BRUIJN CORNELIS C
Year of Publication 07.07.2001
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Year of Publication 07.07.2001
Patent