Degradation of β-Ga2O3 vertical Ni/Au Schottky diodes under forward bias
Sun, Rujun, Balog, Andrew R., Yang, Haobo, Alem, Nasim, Scarpulla, Michael A.
Published in IEEE electron device letters (01.05.2023)
Published in IEEE electron device letters (01.05.2023)
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Journal Article
High Resolution Scanning Transmission Electron Microscopy (S/TEM) Investigation Of Common Defects In Scandium and Aluminum Alloyed β-Ga2O3
Balog, Andrew R, Miao, Leixin, Bachu, Saiphaneendra, Jesenovec, Jani, Dutton, Benjamin, McCloy, John, Alem, Nasim
Published in Microscopy and microanalysis (22.07.2023)
Published in Microscopy and microanalysis (22.07.2023)
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Journal Article
Degradation of β-Ga 2 O 3 Vertical Ni/Au Schottky Diodes Under Forward Bias
Sun, Rujun, Balog, Andrew R., Yang, Haobo, Alem, Nasim, Scarpulla, Michael A.
Published in IEEE electron device letters (01.05.2023)
Published in IEEE electron device letters (01.05.2023)
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Journal Article
Determination of the β to γ Phase Transformation Mechanism in Sc- and Al-Alloyed β-Ga 2 O 3 Crystals
Balog, Andrew R., Lee, Channyung, Duarte-Ruiz, Daniel, Gayathri Ayyagari, Sai Venkata, Jesenovec, Jani, Chmielewski, Adrian E., Miao, Leixin, Dutton, Benjamin L., McCloy, John, Cocchi, Caterina, Ertekin, Elif, Alem, Nasim
Published in ACS applied electronic materials (22.10.2024)
Published in ACS applied electronic materials (22.10.2024)
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Journal Article
Determination of the β to γ Phase Transformation Mechanism in Sc- and Al-Alloyed β‑Ga2O3 Crystals
Balog, Andrew R., Lee, Channyung, Duarte-Ruiz, Daniel, Gayathri Ayyagari, Sai Venkata, Jesenovec, Jani, Chmielewski, Adrian E., Miao, Leixin, Dutton, Benjamin L., McCloy, John, Cocchi, Caterina, Ertekin, Elif, Alem, Nasim
Published in ACS applied electronic materials (22.10.2024)
Published in ACS applied electronic materials (22.10.2024)
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Journal Article