by Sangwan, V.K., Southard, A., Moore, T.L., Ballarotto, V.W., Hines, D.R., Fuhrer, M.S., Williams, E.D.
Published in Microelectronic engineering (01.10.2011)

by Sangwan, V.K., Ballarotto, V.W., Hines, D.R., Fuhrer, M.S., Williams, E.D.
Published in Solid-state electronics (01.10.2010)

by SANGWAN, V.K, BALLAROTTO, V.W, SIEGRIST, K, WILLIAMS, E.D
Published in Journal of microscopy (Oxford) (01.06.2010)

by Sangwan, V.K., Ballarotto, V.W., Hines, D.R., Fuhrer, M.S., Williams, E.D.
Published in Solid-state electronics (01.03.2014)

by Ballarotto, V.W., Siegrist, K., Phaneuf, R.J., Williams, E.D., Mogren, S.
Published in Surface science (01.08.2000)

by Ballarotto, V.W, Little, M.E, Kordesch, M.E
Published in Journal of crystal growth (01.09.2000)

by Montei, E.L, Ballarotto, V.W, Little, M.E, Kordesch, M.E
Published in Journal of electron spectroscopy and related phenomena (01.03.1997)

by Sangwan, V.K., Ballarotto, V.W., Hines, D.R., Fuhrer, M.S., Williams, E.D.
Published in 2009 International Semiconductor Device Research Symposium (01.12.2009)

by Tunnell, A.J., Ballarotto, V.W., Hines, D.R., Williams, E.D.
Published in 2007 International Semiconductor Device Research Symposium (01.12.2007)

by Sangwan, V.K., Ballarotto, V.W., Fuhrer, M.S., Williams, E.D.
Published in 2007 International Semiconductor Device Research Symposium (01.12.2007)

by Hines, D.R., Breban, M., Sangwan, V., Tunnell, A., Williams, E.D., Ballarotto, V.W., Esen, G., Fuhrer, M., Shao, Y., Solin, S.A.
Published in 2005 International Semiconductor Device Research Symposium (2005)