Search Results - "Ball, R D" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Analysis of TID Process, Geometry, and Bias Condition Dependence in 14-nm FinFETs and Implications for RF and SRAM Performance

Analysis of TID Process, Geometry, and Bias Condition Dependence in 14-nm FinFETs and Implications for RF and SRAM Performance

by King, M. P., Wu, X., Eller, M., Samavedam, S., Shaneyfelt, M. R., Silva, A. I., Draper, B. L., Rice, W. C., Meisenheimer, T. L., Felix, J. A., Zhang, E. X., Haeffner, T. D., Ball, D. R., Shetler, K. J., Alles, M. L., Kauppila, J. S., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.01.2017)

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The Effect of Layout Topology on Single-Event Transient Pulse Quenching in a 65 nm Bulk CMOS Process

The Effect of Layout Topology on Single-Event Transient Pulse Quenching in a 65 nm Bulk CMOS Process

by Ahlbin, J R, Gadlage, M J, Ball, D R, Witulski, A W, Bhuva, B L, Reed, R A, Vizkelethy, G, Massengill, L W
Published in IEEE transactions on nuclear science (01.12.2010)

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Empirical Modeling of FinFET SEU Cross Sections Across Supply Voltage

Empirical Modeling of FinFET SEU Cross Sections Across Supply Voltage

by Harrington, R. C., Kauppila, J. S., Maharrey, J. A., Haeffner, T. D., Sternberg, A. L., Zhang, E. X., Ball, D. R., Nsengiyumva, P., Bhuva, B. L., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.07.2019)

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Randomized, prospective, observational simulation study comparing residents’ needle-guided vs free-hand ultrasound techniques for central venous catheter access

Randomized, prospective, observational simulation study comparing residents’ needle-guided vs free-hand ultrasound techniques for central venous catheter access

by Ball, R.D., Scouras, N.E., Orebaugh, S., Wilde, J., Sakai, T.
Published in British journal of anaesthesia : BJA (01.01.2012)

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Impact of Single-Event Transient Duration and Electrical Delay at Reduced Supply Voltages on SET Mitigation Techniques

Impact of Single-Event Transient Duration and Electrical Delay at Reduced Supply Voltages on SET Mitigation Techniques

by Maharrey, J. A., Kauppila, J. S., Harrington, R. C., Nsengiyumva, P., Ball, D. R., Haeffner, T. D., Zhang, E. X., Bhuva, B. L., Holman, W. T., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.01.2018)

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On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology

On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology

by Loveless, T. D., Kauppila, J. S., Jagannathan, S., Ball, D. R., Rowe, J. D., Gaspard, N. J., Atkinson, N. M., Blaine, R. W., Reece, T. R., Ahlbin, J. R., Haeffner, T. D., Alles, M. L., Holman, W. T., Bhuva, B. L., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.12.2012)

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Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection

Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection

by Black, J.D., Ball, D.R., Robinson, W.H., Fleetwood, D.M., Schrimpf, R.D., Reed, R.A., Black, D.A., Warren, K.M., Tipton, A.D., Dodd, P.E., Haddad, N.F., Xapsos, M.A., Kim, H.S., Friendlich, M.
Published in IEEE transactions on nuclear science (01.12.2008)

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Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

by Kauppila, A. V., Bhuva, B. L., Massengill, L. W., Holman, W. T., Ball, D. R.
Published in IEEE transactions on nuclear science (01.12.2011)

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Extubation guidelines: Guedel oropharyngeal airways should not be used as bite blocks

Extubation guidelines: Guedel oropharyngeal airways should not be used as bite blocks

by Falzon, D., Foye, R., Jefferson, P., Ball, D. R.
Published in Anaesthesia (01.08.2012)

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Heavy-Ion-Induced Current Transients in Bulk and SOI FinFETs

Heavy-Ion-Induced Current Transients in Bulk and SOI FinFETs

by El-Mamouni, F., Zhang, E. X., Ball, D. R., Sierawski, B., King, M. P., Schrimpf, R. D., Reed, R. A., Alles, M. L., Fleetwood, D. M., Linten, D., Simoen, E., Vizkelethy, G.
Published in IEEE transactions on nuclear science (01.12.2012)

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Dexamathasone and ondansetron in paediatric tonsillectomy

Dexamathasone and ondansetron in paediatric tonsillectomy

by Falzon, D., Jefferson, P., Ball, D. R.
Published in Anaesthesia (01.02.2012)

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Universal neuromuscular blockade monitoring – a reply

Universal neuromuscular blockade monitoring – a reply

by Rodney, G., Raju, P.K.B.C., Ball, D.R.
Published in Anaesthesia (01.02.2016)

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The effect of cricoid pressure on the cricoid cartilage and vocal cords: an endoscopic study in anaesthetised patients

The effect of cricoid pressure on the cricoid cartilage and vocal cords: an endoscopic study in anaesthetised patients

by Palmer, J. H. MacG, Ball, D. R.
Published in Anaesthesia (01.03.2000)

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Torsades de pointes: provoked by refeeding?

Torsades de pointes: provoked by refeeding?

by Paton, L., Jefferson, P., Ball, D. R.
Published in Anaesthesia (01.12.2010)

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Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

by Ball, D. R., Hutson, J. M., Javanainen, A., Lauenstein, J.-M., Galloway, K. F., Johnson, R. A., Alles, M. L., Sternberg, A. L., Sierawski, B. D., Witulski, A. F., Reed, R. A., Schrimpf, R. D.
Published in IEEE transactions on nuclear science (01.01.2020)

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Monitoring central venous pressure: proximal or distal lumen?

Monitoring central venous pressure: proximal or distal lumen?

by Lake, K., Barker, C., Jefferson, P., Ball, D. R.
Published in Anaesthesia (01.04.2011)

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Tracheostomy ventilation using a laryngeal mask as a ‘bridge to extubation’

Tracheostomy ventilation using a laryngeal mask as a ‘bridge to extubation’

by Ball, D. R., Paton, L., Jefferson, P., Caldwell, D.
Published in Anaesthesia (01.12.2010)

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SE Performance of D-FF Designs With Different V T Options at Near-Threshold Supply Voltages in 7-nm Bulk FinFET Technology

SE Performance of D-FF Designs With Different V T Options at Near-Threshold Supply Voltages in 7-nm Bulk FinFET Technology

by Feeley, A., Xiong, Y., Pieper, N. J., Ball, D. R., Bhuva, B. L.
Published in IEEE transactions on nuclear science (01.07.2022)

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Study of Multicell Upsets in SRAM at a 5-nm Bulk FinFET Node

Study of Multicell Upsets in SRAM at a 5-nm Bulk FinFET Node

by Pieper, Nicholas J., Xiong, Yoni, Feeley, Alexandra, Pasternak, John, Dodds, Nathaniel, Ball, D. R., Bhuva, Bharat L.
Published in IEEE transactions on nuclear science (01.04.2023)

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Effects of Breakdown Voltage on Single-Event Burnout Tolerance of High-Voltage SiC Power MOSFETs

Effects of Breakdown Voltage on Single-Event Burnout Tolerance of High-Voltage SiC Power MOSFETs

by Ball, D. R., Galloway, K. F., Johnson, R. A., Alles, M. L., Sternberg, A. L., Witulski, A. F., Reed, R. A., Schrimpf, R. D., Hutson, J. M., Lauenstein, J.-M.
Published in IEEE transactions on nuclear science (01.07.2021)

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