Electromigration in thin-films for microelectronics
Baldini, G.L., De Munari, I., Scorzoni, A., Fantini, F.
Published in Microelectronics and reliability (1993)
Published in Microelectronics and reliability (1993)
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Journal Article
A resistometric method to characterize electromigration at the wafer level
Scorzoni, A., Cardinali, G.C., Baldini, G.L., Soncini, G.
Published in Microelectronics and reliability (1990)
Published in Microelectronics and reliability (1990)
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Journal Article
Ohmic contact electromigration
Scorzoni, Andrea, Baldini, Gian Luigi, Caprile, Candida
Published in Microelectronics and reliability (1992)
Published in Microelectronics and reliability (1992)
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Journal Article
Electrical properties of thin SiO2 films nitrided in N2O by rapid thermal processing
Severi, M., Mattei, G., Dori, L., Maccagnani, P., Baldini, G.L., Pizzochero, G.
Published in Microelectronic engineering (01.09.1992)
Published in Microelectronic engineering (01.09.1992)
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Journal Article
Electrical properties of thin SiO sub(2) films nitrided in N sub(2)O by rapid thermal processing
Severi, M, Mattei, G, Dori, L, Maccagnani, P, Baldini, G L, Pizzochero, G
Published in Microelectronic engineering (01.01.1992)
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Published in Microelectronic engineering (01.01.1992)
Journal Article
Electrical properties of thin SiO2 films nitrided in N2O by rapid thermal processing
Severi, M., Mattei, G., Dori, L., Maccagnani, P., Baldini, G.L., Pizzochero, G.
Published in ESSDERC '92: 22nd European Solid State Device Research conference (01.09.1992)
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Published in ESSDERC '92: 22nd European Solid State Device Research conference (01.09.1992)
Conference Proceeding