Electrochemical properties of WO3 sol-gel thin films on indium tin oxide/poly(ethylene terephthalate) substrate
Leitzke, D.W., Cholant, C.M., Landarin, D.M., Lucio, C.S., Krüger, L.U., Gündel, A., Flores, W.H., Rodrigues, M.P., Balboni, R.D.C., Pawlicka, A., Avellaneda, C.O.
Published in Thin solid films (01.08.2019)
Published in Thin solid films (01.08.2019)
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Journal Article
Thin films of V2O5/MoO3 and their applications in electrochromism
Cholant, C. M., Westphal, T. M., Balboni, R. D. C., Moura, E. A., Gündel, A., Flores, W. H., Pawlicka, A., Avellaneda, C. O
Published in Journal of solid state electrochemistry (01.05.2017)
Published in Journal of solid state electrochemistry (01.05.2017)
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Journal Article
Electrochemical, UV–Vis, and microscopical characteristics of sol–gel CeO2:V2O5 thin film
Balboni, R. D. C., Lemos, R. M. J., Moura, E. A., Cholant, C. M., Azevedo, C. F., Caldeira, I. M., Gündel, A., Flores, W. H., Pawlicka, A., Avellaneda, C. O.
Published in Journal of materials science. Materials in electronics (01.10.2018)
Published in Journal of materials science. Materials in electronics (01.10.2018)
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Journal Article
Electrochemical properties of thin films of V2O5 doped with TiO2
Moura, E.A., Cholant, C.M., Balboni, R.D.C., Westphal, T.M., Lemos, R.M.J., Azevedo, C.F., Gündel, A., Flores, W.H., Gomez, J.A., Ely, F., Pawlicka, A., Avellaneda, C.O.
Published in The Journal of physics and chemistry of solids (01.08.2018)
Published in The Journal of physics and chemistry of solids (01.08.2018)
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Journal Article
Li+ ions diffusion coefficient in V2O5:MoO3 Sol-Gel films
Cholant, C. M., Azevedo, C. F., Caldeira, I., Balboni, R. D. C., Moura, E. A., Westphal, T. M., Pawlicka, A., Berton, M. A. C., Gomez, J. A., Avellaneda, C. O.
Published in Molecular Crystals and Liquid Crystals (22.09.2017)
Published in Molecular Crystals and Liquid Crystals (22.09.2017)
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Journal Article
Synthesis and characterization of PMMA/silylated MMTs
De Maria, A., Aurora, A., Montone, A., Tapfer, L., Pesce, E., Balboni, R., Schwarz, M., Borriello, C.
Published in Journal of nanoparticle research : an interdisciplinary forum for nanoscale science and technology (01.11.2011)
Published in Journal of nanoparticle research : an interdisciplinary forum for nanoscale science and technology (01.11.2011)
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Journal Article
Quantum effects in silicon for photovoltaic applications
Ingenhoven, P., Anopchenko, A., Tengattini, A., Gandolfi, D., Sgrignuoli, F., Pucker, G., Jestin, Y., Pavesi, L., Balboni, R.
Published in Physica status solidi. A, Applications and materials science (01.06.2013)
Published in Physica status solidi. A, Applications and materials science (01.06.2013)
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Journal Article
Optical characterization of nanocrystals in silicon rich oxide superlattices and porous silicon
Agocs, E., Petrik, P., Milita, S., Vanzetti, L., Gardelis, S., Nassiopoulou, A.G., Pucker, G., Balboni, R., Fried, M.
Published in Thin solid films (28.02.2011)
Published in Thin solid films (28.02.2011)
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Journal Article
Conference Proceeding
Structural analysis and depth profiling of nanometric SiO2/SRO multilayers
Barozzi, M., Gennaro, S., Bersani, M., Vanzetti, L., Jestin, Y., Pucker, G., Milita, S., Balboni, R.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
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Journal Article
Conference Proceeding
Techniques for mechanical strain analysis in sub-micrometer structures: TEM/CBED, micro-Raman spectroscopy, X-ray micro-diffraction and modeling
De Wolf, I, Senez, V, Balboni, R, Armigliato, A, Frabboni, S, Cedola, A, Lagomarsino, S
Published in Microelectronic engineering (01.11.2003)
Published in Microelectronic engineering (01.11.2003)
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Journal Article
Wavy growth onset in strain-balanced InGaAs multi-quantum wells
Nasi, L., Ferrari, C., Lanzi, A., Lazzarini, L., Balboni, R., Clarke, G., Mazzer, M., Rohr, C., Abbott, P., Barnham, K.W.J.
Published in Journal of crystal growth (15.01.2005)
Published in Journal of crystal growth (15.01.2005)
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Journal Article
Strain induced by Ti salicidation in sub-quarter-micron CMOS devices, as measured by TEM/CBED
Benedetti, A., Cullis, A.G., Armigliato, A., Balboni, R., Frabboni, S., Mastracchio, G.F., Pavia, G.
Published in Applied surface science (13.03.2002)
Published in Applied surface science (13.03.2002)
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Journal Article
Conference Proceeding
TEM/CBED determination of strain in silicon-based submicrometric electronic devices
Armigliato, A, Balboni, R, Balboni, S, Frabboni, S, Tixier, A, Carnevale, G.P, Colpani, P, Pavia, G, Marmiroli, A
Published in Micron (Oxford, England : 1993) (01.06.2000)
Published in Micron (Oxford, England : 1993) (01.06.2000)
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Journal Article
Growth kinetics of a displacement field in hydrogen implanted single crystalline silicon
Bisero, D., Corni, F., Frabboni, S., Tonini, R., Ottaviani, G., Balboni, R.
Published in Journal of applied physics (15.04.1998)
Published in Journal of applied physics (15.04.1998)
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Journal Article
Dynamical simulation of LACBED patterns in cross-sectioned heterostructures
Wu, F., Armigliato, A., Balboni, R., Frabboni, S.
Published in Micron (Oxford, England : 1993) (01.06.2000)
Published in Micron (Oxford, England : 1993) (01.06.2000)
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Journal Article
Local epitaxy from the silicon substrate in silicon–rich SiC during Si–nanocrystals formation
Canino, M., Balboni, R., Desalvo, A., Centurioni, E., Rizzoli, R., Bellettato, M., Summonte, C.
Published in Thin solid films (30.04.2017)
Published in Thin solid films (30.04.2017)
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Journal Article
A comparison between normally and highly accelerated electromigration tests
Foley, S., Scorzoni, A., Balboni, R., Impronta, M., De Munari, I., Mathewson, A., Fantini, F.
Published in Microelectronics and reliability (01.06.1998)
Published in Microelectronics and reliability (01.06.1998)
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Journal Article
Conference Proceeding
Determination of bulk mismatch values in trasmission electron microscopy cross-sections of heteostructures by convergent-beam electron diffraction
Balboni, R., Frabboni, S., Armigliato, A.
Published in Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties (01.01.1998)
Published in Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties (01.01.1998)
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Journal Article