Wafer-scale functional circuits based on two dimensional semiconductors with fabrication optimized by machine learning
Chen, Xinyu, Xie, Yufeng, Sheng, Yaochen, Tang, Hongwei, Wang, Zeming, Wang, Yu, Wang, Yin, Liao, Fuyou, Ma, Jingyi, Guo, Xiaojiao, Tong, Ling, Liu, Hanqi, Liu, Hao, Wu, Tianxiang, Cao, Jiaxin, Bu, Sitong, Shen, Hui, Bai, Fuyu, Huang, Daming, Deng, Jianan, Riaud, Antoine, Xu, Zihan, Wu, Chenjian, Xing, Shiwei, Lu, Ye, Ma, Shunli, Sun, Zhengzong, Xue, Zhongyin, Di, Zengfeng, Gong, Xiao, Zhang, David Wei, Zhou, Peng, Wan, Jing, Bao, Wenzhong
Published in Nature communications (12.10.2021)
Published in Nature communications (12.10.2021)
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Journal Article
Gate Stack Engineering in MoS2 Field‐Effect Transistor for Reduced Channel Doping and Hysteresis Effect
Sheng, Yaochen, Chen, Xinyu, Liao, Fuyou, Wang, Yin, Ma, Jingyi, Deng, Jianan, Guo, Zhongxun, Bu, Sitong, Shen, Hui, Bai, Fuyu, Huang, Daming, Wang, Jianlu, Hu, Weida, Chen, Lin, Zhu, Hao, Sun, Qingqing, Zhou, Peng, Zhang, David Wei, Wan, Jing, Bao, Wenzhong
Published in Advanced electronic materials (01.07.2021)
Published in Advanced electronic materials (01.07.2021)
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Journal Article
Gate Stack Engineering in MoS 2 Field‐Effect Transistor for Reduced Channel Doping and Hysteresis Effect
Sheng, Yaochen, Chen, Xinyu, Liao, Fuyou, Wang, Yin, Ma, Jingyi, Deng, Jianan, Guo, Zhongxun, Bu, Sitong, Shen, Hui, Bai, Fuyu, Huang, Daming, Wang, Jianlu, Hu, Weida, Chen, Lin, Zhu, Hao, Sun, Qingqing, Zhou, Peng, Zhang, David Wei, Wan, Jing, Bao, Wenzhong
Published in Advanced electronic materials (01.07.2021)
Published in Advanced electronic materials (01.07.2021)
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Journal Article
Effect of Surface and Interface on the Back-Gated n-MOSFET with Two-Dimensional MoS2 Channel Grown by Chemical Vapor Deposition
Bai, Fuyu, Shen, Hui, Huang, Daming
Published in 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2018)
Published in 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2018)
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Conference Proceeding