by McPherson, J.W., Baglee, D.A.
Published in 23rd International Reliability Physics Symposium (01.03.1985)

by Baglee, D.A., Smayling, M.C.
Published in 1985 International Electron Devices Meeting (1985)

by Baglee, D.A., Sugawara, T., Fukawa, S., Mori, K., Bellay, L.M., Miller, T.
Published in 25th International Reliability Physics Symposium (01.04.1987)

by Baglee, D.A., Duvvury, C.
Published in IEEE electron device letters (01.10.1984)

by Miller, T., Illyes, S., Baglee, D.A.
Published in 28th Annual Proceedings on Reliability Physics Symposium (1990)

by Baglee, D.A., Nannemann, L., Huang, C.
Published in 28th Annual Proceedings on Reliability Physics Symposium (1990)

by Baglee, D.A.
Published in IEEE electron device letters (01.04.1983)

by Baglee, D.A., Duvvury, C., Smayling, M.C., Duane, M.P.
Published in IEEE transactions on electron devices (01.01.1985)

by Duvvury, C., McPhee, R.A., Baglee, D.A., Rountree, R.N.
Published in 24th International Reliability Physics Symposium (01.04.1986)

by Baglee, D.A., Beydler, C., Shih, P., Yashiro, M.
Published in 24th International Reliability Physics Symposium (01.04.1986)

by Schafft, H.A., Baglee, D.A., Kennedy, P.E.
Published in 29th Annual Proceedings Reliability Physics 1991 (1991)

by Baglee, D.A., Doering, R.R., Elahy, M., Yashiro, M., Clark, D., Crank, S., Armstrong, G.
Published in 1985 International Electron Devices Meeting (1985)

by Duvvury, C., Baglee, D.A., Smayling, M.C., Duane, M.P.
Published in 1983 International Electron Devices Meeting (1983)