by Park, J-Y, Yu, J, Kim, C-S, Baek, J-W, Jo, Y, Kim, Y-K
Published in Anaesthesia (01.06.2023)

by Lee, H, Kim, S H, Baek, J W, Jin, S-C
Published in American journal of neuroradiology : AJNR (01.06.2022)

by Heo, Y J, Jeong, H W, Baek, J W, Kim, S T, Jeong, Y G, Lee, J Y, Jin, S-C
Published in American journal of neuroradiology : AJNR (01.05.2019)

by Baek, H J, Heo, Y J, Kim, D, Yun, S Y, Baek, J W, Jeong, H W, Choo, H J, Lee, J Y, Oh, S-I
Published in American journal of neuroradiology : AJNR (01.06.2022)

by Kim, D, Heo, Y J, Jeong, H W, Baek, J W, Han, J-Y, Lee, J Y, Jin, S-C, Baek, H J
Published in American journal of neuroradiology : AJNR (01.09.2019)

by Cho, Y G, Baek, J W
Published in IOP conference series. Materials Science and Engineering (01.10.2020)

by Arenz, M, Baek, W.-J, Beck, M, Beglarian, A, Behrens, J, Bergmann, T, Berlev, A
Published in The European physical journal. C, Particles and fields (09.05.2018)

by Kim, S-T, Baek, J W, Jin, S-C, Park, J H, Kim, J S, Kim, H Y, Jeong, H W, Jeong, Y G
Published in American journal of neuroradiology : AJNR (01.01.2019)

by Ju Won Baek, Dong Wook Yoo, Rim, G.H., Jih-Sheng Lai
Published in IEEE transactions on plasma science (01.08.2005)

by Jung, Jee-Hoon, Kim, Ho-Sung, Ryu, Myung-Hyo, Baek, Ju-Won
Published in IEEE transactions on power electronics (01.04.2013)

by Kim, Ho-Sung, Ryu, Myung-Hyo, Baek, Ju-Won, Jung, Jee-Hoon
Published in IEEE transactions on power electronics (01.04.2013)

by Kim, Ho-Sung, Baek, Ju-Won, Ryu, Myung-Hyu, Kim, Jong-Hyun, Jung, Jee-Hoon
Published in IEEE transactions on power electronics (01.08.2014)

by Altenmüller, K, W -J Baek, Berlev, A, Blaum, K, Block, F, Bobien, S, Bornschein, L, Bouquet, H, Chilingaryan, S, Descher, M, Drexlin, G, Dyba, S, Edzards, F, Eitel, K, Ellinger, E, Engel, R, Enomoto, S, Felden, A, Franklin, G B, Frankrone, H, Friedel, F, Fuchs, D, Gauda, K, Gil, W, Glück, F, Gumbsheimer, R, Hackenjos, M, Haußmann, N, Heizmann, F, Helbing, K, Hillesheimer, D, Höhn, T, Holzmann, S, Houdy, T, Jansen, A, Karl, C, Kellerer, J, Klein, M, Köhler, C, Köllenberger, L, Kopmann, A, Korzeczek, M, Kovalík, A, Kunka, N, La Cascio, L, Lebeda, O, Lehnert, B, Letnev, J, Leven, F, Le, T L, Machatschek, M, Marsteller, A, Martin, E L, Megas, F, Melzer, C, Menshikov, A, Mertens, S, Meier, M, Mirz, S, Morales Guzmán, P I, Müller, K, Naumann, U, Osipowicz, A, Otten, E, Parno, D S, Pollithy, A, Poyato, J M L, Priester, F, Ranitzsch, P C -O, Rest, O, Robertson, R G H, Rodenbeck, C, Rohr, P, Ryšavý, M, Saenz, A, Schlösser, M, Schlüter, L, Schrank, M, Schulz, B, Seitz-Moskaliuk, H, Seller, W, Siegmann, D, Steven, M, Sturm, M, Sun, M, Tcherniakhovski, D, Thorne, L A, Thümmler, T, Tkachev, I, Trost, N, Urban, K, Valerius, K, Vianden, R, Weber, M, Weinheimer, C, Weiss, C, Wilkerson, J F, Wolf, J, Zadorozhny, S, Zeller, G
Published in arXiv.org (13.09.2019)

by CHO, J.-G, BAEK, J.-W, RIM, G.-H, KANG, I
Published in IEEE transactions on power electronics (01.01.1998)

by Arenz, M., Beck, M., Behrens, J., Berlev, A., Besserer, U., Bode, T., Bornschein, B., Brunst, T., Buzinsky, N., Chilingaryan, S., Choi, W.Q., Deffert, M., Doe, P.J., Drexlin, G., Dyba, S., Edzards, F., Eitel, K., Ellinger, E., Erhard, M., Fischer, S., Formaggio, J.A., Fränkle, F.M., Friedel, F., Fulst, A., Gil, W., Grössle, R., Gumbsheimer, R., Hackenjos, M., Hannen, V., Harms, F., Haußmann, N., Heizmann, F., Helbing, K., Herz, W., Hilk, D., Hillesheimer, D., Howe, M.A., Huber, A., Jansen, A., Kernert, N., Kippenbrock, L., Kleesiek, M., Klein, M., Kopmann, A., Korzeczek, M., Kovalík, A., Krasch, B., Kraus, M., Kuckert, L., Lasserre, T., Lebeda, O., Letnev, J., Machatschek, M., Marsteller, A., Martin, E.L., Mertens, S., Mirz, S., Monreal, B., Naumann, U., Neumann, H., Niemes, S., Off, A., Osipowicz, A., Parno, D.S., Pollithy, A., Poon, A.W.P., Priester, F., Roccati, F., Röttele, C., Ryšavý, M., Saenz, A., Schimpf, L., Schlösser, K., Schrank, M., Seitz-Moskaliuk, H., Sentkerestiová, J., Sibille, V., Slezák, M., Steidl, M., Steinbrink, N., Sturm, M., Suchopar, M., Suesser, M., Telle, H.H., Thorne, L.A., Thümmler, T., Titov, N., Trost, N., Valerius, K., Vénos, D., Vianden, R., Hernández, A.P. Vizcaya, Weinheimer, C., Weiss, C., Welte, S., Wendel, J., Wilkerson, J.F., Wolf, J., Wüstling, S., Zadoroghny, S.
Published in Journal of instrumentation (01.04.2018)

by Baek, J. W., Kim, H. S., Ryu, M. H., Kim, J. H., Kim, T. J.
Published in 2015 9th International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) (01.06.2015)

by Altenmüller, K., Arenz, M., Baek, W.-J., Beglarian, A., Behrens, J., Bergmann, T., Berlev, A., Besserer, U., Blaum, K., Bobien, S., Bode, T., Bornschein, B., Bornschein, L., Brunst, T., Chilingaryan, S., Deffert, M., Doe, P.J., Dragoun, O., Drexlin, G., Dyba, S., Edzards, F., Eitel, K., Ellinger, E., Engel, R., Enomoto, S., Erhard, M., Eversheim, D., Fränkle, F.M., Gil, W., Glück, F., Gonzalez Ureña, A., Grohmann, S., Grössle, R., Gumbsheimer, R., Hackenjos, M., Hannen, V., Harms, F., Haußmann, N., Helbing, K., Herz, W., Hickford, S., Hilk, D., Hillesheimer, D., Howe, M.A., Kellerer, J., Kleesiek, M., Klein, M., Korzeczek, M., Krasch, B., Kraus, M., Kuckert, L., Leiber, B., Letnev, J., Machatschek, M., Marsteller, A., Martin, E.L., Monreal, B., Niemes, S., Off, A., Osipowicz, A., Otten, E., Parno, D.S., Pollithy, A., Ranitzsch, P.C.-O., Rest, O., Robertson, R.G.H., Roccati, F., Rodenbeck, C., Röllig, M., Röttele, C., Ryšavý, M., Schimpf, L., Schlösser, K., Schlösser, M., Schönung, K., Schrank, M., Sentkerestiová, J., Sibille, V., Slezák, M., Steidl, M., Steinbrink, N., Sturm, M., Suchopar, M., Suesser, M., Thümmler, T., Titov, N., Tkachev, I., Trost, N., Valerius, K., Vénos, D., Vianden, R., Vizcaya Hernández, A.P., Wandkowsky, N., Weber, M., Weinheimer, C., Wendel, J., Wilkerson, J.F., Wüstling, S., Zadoroghny, S., Zeller, G.
Published in Astroparticle physics (01.03.2019)

by Jung, J.-H, Ahmed, S., Baek, J.-W
Published in 8th International Conference on Power Electronics - ECCE Asia (01.05.2011)

by Arenz, M., Baek, W.-J., Beck, M., Beglarian, A., Behrens, J., Berlev, A., Besserer, U., Blaum, K., Bode, T., Bornschein, B., Brunst, T., Buzinsky, N., Chilingaryan, S., Choi, W.Q., Deffert, M., Doe, P.J., Dragoun, O., Drexlin, G., Dyba, S., Edzards, F., Eitel, K., Ellinger, E., Engel, R., Erhard, M., Formaggio, J.A., Fränkle, F.M., Franklin, G.B., Friedel, F., Fulst, A., Gil, W., Glück, F., Ureña, A. Gonzalez, Grohmann, S., Grössle, R., Gumbsheimer, R., Hackenjos, M., Hannen, V., Harms, F., Haußmann, N., Heizmann, F., Herz, W., Hickford, S., Hilk, D., Howe, M.A., Huber, A., Kellerer, J., Kernert, N., Kippenbrock, L., Kleesiek, M., Klein, M., Kopmann, A., Korzeczek, M., Krasch, B., Lasserre, T., Lokhov, A., Machatschek, M., Marsteller, A., Martin, E.L., Monreal, B., Neumann, H., Niemes, S., Off, A., Otten, E., Parno, D.S., Pollithy, A., Poon, A.W.P., Priester, F., Ranitzsch, P.C.-O., Rest, O., Robertson, R.G.H., Roccati, F., Rodenbeck, C., Röllig, M., Röttele, C., Ryšavý, M., Sack, R., Saenz, A., Schlösser, K., Schlösser, M., Schönung, K., Seitz-Moskaliuk, H., Sentkerestiová, J., Sibille, V., Slezák, M., Steidl, M., Sturm, M., Suchopar, M., Telle, H.H., Thümmler, T., Trost, N., Valerius, K., Vianden, R., Hernández, A.P. Vizcaya, Weber, M., Weiss, C., Welte, S., Wendel, J., Wolf, J., Wüstling, S., Zadoroghny, S.
Published in Journal of instrumentation (13.08.2018)

by Baek, J.W., Ryu, M.H., Yoo, D.W., Rim, G.H.
Published in 30th Annual Conference of IEEE Industrial Electronics Society, 2004. IECON 2004 (2004)