Reliability characterizations of display driver IC on High-k/ metal-gate technology
Donghoon Kim, Jungdong Kim, Kidan Bae, Hyejin Kim, Lira Hwang, Sangchul Shin, Hyung-Nyung Park, In-Taek Ku, Jongwoo Park, Sangwoo Pae, Haebum Lee
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
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Conference Proceeding
Systematic reliability characterizations on Average Output Voltage (AVO) shift of Display Driver IC by HTOL
Jungdong Kim, Donghun Kim, Minhyeok Choe, Kidan Bae, Sangchul Shin, Sangwoo Pae, Jongwoo Park
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
Frequency dependent TDDB behaviors and its reliability qualification in 32nm high-k/metal gate CMOSFETs
Kyong Taek Lee, Jongik Nam, Minjung Jin, Kidan Bae, Junekyun Park, Lira Hwang, Jungin Kim, Hyunjin Kim, Jongwoo Park
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Published in 2011 International Reliability Physics Symposium (01.04.2011)
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Conference Proceeding
Effects of N-Rich TiN Capping Layer on Reliability in Gate-Last High-k/Metal Gate MOSFETs
Bae, Kidan, Lee, Kyung Taek, Sagong, Hyun Chul, Choe, Minhyeok, Lee, Hyunwoo, Kim, Sungeun, Kim, Kwang-Soo, Park, Junekyun, Pae, Sangwoo, Park, Jongwoo
Published in ECS transactions (31.08.2013)
Published in ECS transactions (31.08.2013)
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Journal Article
Behaviors and physical degradation of HfSiON MOSFET linked to strained CESL performance booster
Kidan Bae, Minjung Jin, Hajin Lim, Lira Hwang, Dongseok Shin, Junekyun Park, Jinchul Heo, Jongho Lee, Jinho Do, Ilchan Bae, Chulhee Jeon, Jongwoo Park
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Published in 2011 International Reliability Physics Symposium (01.04.2011)
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Conference Proceeding
Mature processability and manufacturability by characterizing VT and Vmin behaviors induced by NBTI and AHTOL test
Jongwoo Park, Sungmok Ha, Sunme Lim, Jae-Yoon Yoo, Junkyun Park, Kidan Bae, Gunrae Kim, Min Kim, Yongshik Kim
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
Effects of N-Rich TiN Capping Layer On Reliability in 20nm Gate-Last High-k/Metal Gate Mosfets
Bae, Kidan, Lee, Kyongtaek, Sagong, Hyunchul, Choe, Minhyeok, Lee, Hyunwoo, Kim, Sungeun, Kim, Kwang-Soo, Park, Junekyun, Pae, Sangwoo, Park, Jongwoo
Published in Meeting abstracts (Electrochemical Society) (27.10.2013)
Published in Meeting abstracts (Electrochemical Society) (27.10.2013)
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Journal Article