Microstructure of Pt-modified aluminide coatings on Ni-based superalloys
Benoist, J., Badawi, K.F., Malié, A., Ramade, C.
Published in Surface & coatings technology (01.04.2004)
Published in Surface & coatings technology (01.04.2004)
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Journal Article
Atomistic calculation of size effects on elastic coefficients in nanometre-sized tungsten layers and wires
Villain, P, Beauchamp, P, Badawi, K.F, Goudeau, P, Renault, P.-O
Published in Scripta materialia (01.05.2004)
Published in Scripta materialia (01.05.2004)
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Journal Article
Microstructure of Pt modified aluminide coatings on Ni-based superalloys without prior Pt diffusion
Benoist, J., Badawi, K.F., Malié, A., Ramade, C.
Published in Surface & coatings technology (20.04.2005)
Published in Surface & coatings technology (20.04.2005)
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Journal Article
Damage mode tensile testing of thin gold films on polyimide substrates by X-ray diffraction and atomic force microscopy
Renault, P.O., Villain, P., Coupeau, C., Goudeau, P., Badawi, K.F.
Published in Thin solid films (31.01.2003)
Published in Thin solid films (31.01.2003)
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Journal Article
Characterization of thin film elastic properties using X-ray diffraction and mechanical methods: application to polycrystalline stainless steel
Goudeau, P, Renault, P.O, Villain, P, Coupeau, C, Pelosin, V, Boubeker, B, Badawi, K.F, Thiaudière, D, Gailhanou, M
Published in Thin solid films (01.11.2001)
Published in Thin solid films (01.11.2001)
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Journal Article
Study of the mechanical and microstructural state of platinum thin films
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Journal Article
Conference Proceeding
X-ray Diffraction Study of Thin Film Elastic Properties
Villain, P., Goudeau, P., Renault, P.-O., Badawi, K.F.
Published in Advanced engineering materials (01.08.2002)
Published in Advanced engineering materials (01.08.2002)
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Journal Article
Conference Proceeding
Influence of microstructure on residual stress in tungsten thin films analyzed by X-ray diffraction
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Journal Article
Conference Proceeding
Profile analysis of thin film X-ray diffraction peaks
Bimbault, L., Badawi, K.F., Goudeau, Ph, Branger, V., Durand, N.
Published in Thin solid films (01.04.1996)
Published in Thin solid films (01.04.1996)
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Journal Article
Conference Proceeding
Mechanical strength assessment of very thin films for optical and electronic applications
Consiglio, R, Durand, N, Badawi, K.F, Macquart, P, Lerbet, F, Assoul, M, von Stebut, J
Published in Surface & coatings technology (01.12.1997)
Published in Surface & coatings technology (01.12.1997)
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Journal Article
Conference Proceeding
Residual stress determination by X-ray diffraction in tungsten thin films
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Journal Article
Conference Proceeding