An efficient 3D deep convolutional network for Alzheimer's disease diagnosis using MR images
Backstrom, Karl, Nazari, Mahmood, Gu, Irene Yu-Hua, Jakola, Asgeir Store
Published in 2018 IEEE 15th International Symposium on Biomedical Imaging (ISBI 2018) (01.04.2018)
Published in 2018 IEEE 15th International Symposium on Biomedical Imaging (ISBI 2018) (01.04.2018)
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Conference Proceeding
Deep Learning Based Harmonics and Interharmonics Pre-Detection Designed for Compensating Significantly Time-varying EAF Currents
Balouji, Ebrahim, Backstrom, Karl, McKelvey, Tomas, Salor, Ozgul
Published in 2019 IEEE Industry Applications Society Annual Meeting (01.09.2019)
Published in 2019 IEEE Industry Applications Society Annual Meeting (01.09.2019)
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Conference Proceeding
Consistent Lock-free Parallel Stochastic Gradient Descent for Fast and Stable Convergence
Backstrom, Karl, Walulya, Ivan, Papatriantafilou, Marina, Tsigas, Philippas
Published in 2021 IEEE International Parallel and Distributed Processing Symposium (IPDPS) (01.05.2021)
Published in 2021 IEEE International Parallel and Distributed Processing Symposium (IPDPS) (01.05.2021)
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Conference Proceeding
MindTheStep-AsyncPSGD: Adaptive Asynchronous Parallel Stochastic Gradient Descent
Backstrom, Karl, Papatriantafilou, Marina, Tsigas, Philippas
Published in 2019 IEEE International Conference on Big Data (Big Data) (01.12.2019)
Published in 2019 IEEE International Conference on Big Data (Big Data) (01.12.2019)
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Conference Proceeding
A Deep Learning Approach to Earth Fault Classification and Source Localization
Balouji, Ebrahim, Backstrom, Karl, Hovila, Petri
Published in 2020 IEEE PES Innovative Smart Grid Technologies Europe (ISGT-Europe) (26.10.2020)
Published in 2020 IEEE PES Innovative Smart Grid Technologies Europe (ISGT-Europe) (26.10.2020)
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Conference Proceeding
Controlled time series generation for automotive software-in-the-loop testing using GANs
Parthasarathy, Dhasarathy, Backstrom, Karl, Henriksson, Jens, Einarsdottir, Solrun
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)
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Conference Proceeding