Limiting Factors of the Safe Operating Area for Power Devices
Schulze, H-J, Niedernostheide, F-J, Pfirsch, F., Baburske, R.
Published in IEEE transactions on electron devices (01.02.2013)
Published in IEEE transactions on electron devices (01.02.2013)
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Journal Article
The \hbox^-Junction as the Key to Improved Ruggedness and Soft Recovery of Power Diodes
Lutz, J., Baburske, R., Min Chen, Heinze, B., Domeij, M., Felsl, H.-P., Schulze, H.-J.
Published in IEEE transactions on electron devices (01.11.2009)
Published in IEEE transactions on electron devices (01.11.2009)
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Journal Article
Optimization of diodes using the SPEED concept and CIBH
Pfaffenlehner, M., Felsl, Hans-Peter, Niedernostheide, F.-J, Pfirsch, F., Schulze, H.-J, Baburske, R., Lutz, J.
Published in 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs (01.05.2011)
Published in 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs (01.05.2011)
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Conference Proceeding
Si IGBT and SiC MOSFET - Potentials and Limitations of Plasma Shaping versus Unipolar Switching in Medium Power Applications
Baburske, Roman, Pfirsch, Frank, Hansel, Jana, Waschneck, Katja
Published in 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (28.05.2023)
Published in 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (28.05.2023)
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Conference Proceeding
Challenges Regarding Parallel Connection of SiC JFETs
Peftitsis, D., Baburske, R., Rabkowski, J., Lutz, J., Tolstoy, G., Nee, H.
Published in IEEE transactions on power electronics (01.03.2013)
Published in IEEE transactions on power electronics (01.03.2013)
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Journal Article
Explorative Study of a Novel Desaturation IGBT with Transconductance Modulation
Baburske, Roman, Hansel, Jana, Pfirsch, Frank, Von Treek, Vera, Niedernostheide, Franz-Josef
Published in 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (02.06.2024)
Published in 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (02.06.2024)
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Conference Proceeding
3D Simulation Study of a Novel 1200 V IGBT Concept for EMI-Critical Applications
Philippou, Alexander, Arnold, Thorsten, Imperiale, Ilaria, Baburske, Roman, Niedernostheide, Franz-Josef, Thees, Hans-Jurgen, Schmidt, Steffen
Published in 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (02.06.2024)
Published in 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (02.06.2024)
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Conference Proceeding
Cathode-Side Current Filaments in High-Voltage Power Diodes Beyond the SOA Limit
Baburske, R., Niedernostheide, F., Lutz, J., Schulze, H., Falck, E., Bauer, J. G.
Published in IEEE transactions on electron devices (01.07.2013)
Published in IEEE transactions on electron devices (01.07.2013)
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Journal Article
Intrinsic Propensity of IGBTs to High-Frequency Short-Circuit Oscillations
van Treek, Vera, Pfirsch, Frank, Niedernostheide, Franz-Josef, Baburske, Roman, Specht, Judith
Published in 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.09.2020)
Published in 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.09.2020)
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Conference Proceeding
Al modification as indicator of current filaments in IGBTs under repetitive SC operation
Mysore, Madhu Lakshman, Bhojani, Riteshkumar, Kowalsky, Jens, Lutz, Josef, Baburske, Roman, Schulze, Hans-Joachim, Niedernostheide, Franz-Josef
Published in IET power electronics (18.12.2019)
Published in IET power electronics (18.12.2019)
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Journal Article
RC-GID IGBT - A novel reverse-conducting IGBT with a gate voltage independent diode characteristic and low power losses
Tran, Quang Tien, Niedernostheide, Franz-Josef, Pfirsch, Frank, Mauder, Anton, Baburske, Roman, Eckel, Hans-Gunter
Published in 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (30.05.2021)
Published in 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (30.05.2021)
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Conference Proceeding
Observation of current filaments in IGBTs with thermoreflectance microscopy
Bhojani, Riteshkumar, Kowalsky, Jens, Lutz, Josef, Kendig, Dustin, Baburske, Roman, Schulze, Hans-Joachim, Niedernostheide, Franz-Josef
Published in 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.05.2018)
Published in 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.05.2018)
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Conference Proceeding