Generalization of the Nyquist robust stability margin and its application to systems with real affine parametric uncertainties
Baab, Charles T., Cockburn, Juan C., Latchman, Haniph A., Crisalle, Oscar D.
Published in International journal of robust and nonlinear control (15.12.2001)
Published in International journal of robust and nonlinear control (15.12.2001)
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Journal Article
Method and apparatus for using universal cavity wafer in wafer level packaging
Baab, Charles, Mueller, Andrew, Karpman, Maurice, Rickley, Michael, Mueller, Nicole, Thompson, Jeffrey
Year of Publication 17.09.2019
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Year of Publication 17.09.2019
Patent
METHOD AND APPARATUS FOR USING UNIVERSAL CAVITY WAFER IN WAFER LEVEL PACKAGING
Baab, Charles, Mueller, Andrew, Karpman, Maurice, Rickley, Michael, Mueller, Nicole, Thompson, Jeffrey
Year of Publication 19.04.2018
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Year of Publication 19.04.2018
Patent
Method and apparatus for using universal cavity wafer in wafer level packaging
Thompson Jeffrey, Karpman Maurice, Mueller Nicole, Baab Charles, Mueller Andrew, Rickley Michael
Year of Publication 19.12.2017
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Year of Publication 19.12.2017
Patent
METHOD AND APPARATUS FOR USING UNIVERSAL CAVITY WAFER IN WAFER LEVEL PACKAGING
Thompson Jeffrey, Karpman Maurice, Mueller Nicole, Baab Charles, Mueller Andrew, Rickley Michael
Year of Publication 15.12.2016
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Year of Publication 15.12.2016
Patent