Search Results - "BYUN DO HOON" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

SEMICONDUCTOR CHIP AND TEST METHOD OF THE SAME

SEMICONDUCTOR CHIP AND TEST METHOD OF THE SAME

by Kwak, Min Woo, Lee, Kwan Seong, Lee, Jae Ho, Choi, Jae Seung, Jung, Yeon Ho, Kim, Mi Joung, Byun, Do Hoon, Choi, Hwang Ho, Kye, Jong Wook, Park, Chan Wook
Year of Publication 08.06.2023

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Patent

INTEGRATED CIRCUIT AND AN ELECTRONIC DEVICE INCLUDING INTEGRATED CIRCUIT

INTEGRATED CIRCUIT AND AN ELECTRONIC DEVICE INCLUDING INTEGRATED CIRCUIT

by Kwak, Min Woo, Lee, Kwan Seong, Lee, Jae Ho, Choi, Jae Seung, Jung, Yeon Ho, Kim, Mi Joung, Byun, Do Hoon, Ryu, Je Kyun, Kye, Jong Wook, Park, Chan Wook
Year of Publication 30.03.2023

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Patent

Method of programming one-time programmable (OTP) memory device and method of testing semiconductor integrated circuit including the same

Method of programming one-time programmable (OTP) memory device and method of testing semiconductor integrated circuit including the same

by Byun Do-Hoon, Sim Chang-Su, Hong Na-Rae
Year of Publication 05.09.2017

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Patent

METHOD OF PROGRAMMING ONE-TIME PROGRAMMABLE (OTP) MEMORY DEVICE AND METHOD OF TESTING SEMICONDUCTOR INTEGRATED CIRCUIT INCLUDING THE SAME

METHOD OF PROGRAMMING ONE-TIME PROGRAMMABLE (OTP) MEMORY DEVICE AND METHOD OF TESTING SEMICONDUCTOR INTEGRATED CIRCUIT INCLUDING THE SAME

by Byun Do-Hoon, Sim Chang-Su, Hong Na-Rae
Year of Publication 09.02.2017

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Patent

Systems for testing a plurality of circuit devices

Systems for testing a plurality of circuit devices

by Byun, Do-hoon, Seo, Ki-myung
Year of Publication 13.09.2005

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Patent

Systems and methods for testing a plurality of circuit devices

Systems and methods for testing a plurality of circuit devices

by Seo, Ki-Myung, Byun, Do-Hoon
Year of Publication 21.08.2003

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Patent

Test apparatuses for semiconductor integrated circuits

Test apparatuses for semiconductor integrated circuits

by Seo, Ki-Myung, Jeon, Jae-Kuk, Byun, Do-Hoon
Year of Publication 22.06.2004

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Patent

Test apparatuses for semiconductor integrated circuits

Test apparatuses for semiconductor integrated circuits

by Seo, Ki-Myung, Jeon, Jae-Kuk, Byun, Do-Hoon
Year of Publication 05.06.2003

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Patent

Systems for testing a plurality of circuit devices

Systems for testing a plurality of circuit devices

by BYUN DO-HOON, SEO KI-MYUNG
Year of Publication 13.09.2005

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Patent

SEMICONDUCTOR TEST SYSTEM CAPABLE OF VIRTUAL TEST AND SEMICONDUCTOR TEST METHOD THEREOF

SEMICONDUCTOR TEST SYSTEM CAPABLE OF VIRTUAL TEST AND SEMICONDUCTOR TEST METHOD THEREOF

by YUN BYONG-HUI, SEO KI-MYUNG, BYUN DO-HOON
Year of Publication 20.03.2008

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Patent

Mimicking unfolding motion of a beetle hind wing

Mimicking unfolding motion of a beetle hind wing

by Muhammad, Azhar, Park, Hoon C., Hwang, Do Y., Byun, Doyoung, Goo, Nam S.
Published in Chinese science bulletin (01.07.2009)

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Journal Article

SEMICONDUCTOR TEST SYSTEM BY WHICH VIRTUAL TEST IS POSSIBLE, AND ITS SEMICONDUCTOR TEST METHOD

SEMICONDUCTOR TEST SYSTEM BY WHICH VIRTUAL TEST IS POSSIBLE, AND ITS SEMICONDUCTOR TEST METHOD

by YUN BYONG-HUI, SEO KI-MYUNG, BYUN DO-HOON
Year of Publication 10.01.2008

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Patent

SEMICONDUCTOR TEST SYSTEM BEING CAPABLE OF VIRTUAL TEST AND SEMICONDUCTOR TEST METHOD THEREOF

SEMICONDUCTOR TEST SYSTEM BEING CAPABLE OF VIRTUAL TEST AND SEMICONDUCTOR TEST METHOD THEREOF

by BYUN, DO HOON, YUN, BYONG HUI, SEO, KI MYUNG
Year of Publication 26.12.2007

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Patent

CONTROL CIRCUIT FOR DEVICE FOR OPENING AND CLOSING CONTACT, AND SYSTEM AND METHOD FOR TESTING SEMICONDUCTOR CHIP USING THE SAME

CONTROL CIRCUIT FOR DEVICE FOR OPENING AND CLOSING CONTACT, AND SYSTEM AND METHOD FOR TESTING SEMICONDUCTOR CHIP USING THE SAME

by BYUN DO-HOON, SEO KI-MYUNG
Year of Publication 02.10.2003

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Patent

Systems and methods for testing a plurality of circuit devices

Systems and methods for testing a plurality of circuit devices

by BYUN DO-HOON, SEO KI-MYUNG
Year of Publication 21.08.2003

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Patent

Methods for testing a plurality of semiconductor devices in parallel and related apparatus

Methods for testing a plurality of semiconductor devices in parallel and related apparatus

by YUN BYONG-HUI, SEO KI-MYUNG, BYUN DO-HOON
Year of Publication 15.03.2007

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Patent

Semiconductor components test-device, has write unit coupled to control unit for writing chip identification data into semiconductor elements

Semiconductor components test-device, has write unit coupled to control unit for writing chip identification data into semiconductor elements

by BYUN, DO-HOON, YUN, BYONG-HUI, SEO, KI-MYUNG
Year of Publication 22.02.2007

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Patent

DATA WRITING APPARATUS AND METHOD FOR EDS TEST

DATA WRITING APPARATUS AND METHOD FOR EDS TEST

by BYUN, DO HOON, YUN, BYONG HUI, SEO, KI MYUNG
Year of Publication 21.12.2006

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Patent

Test apparatuses for semiconductor integrated circuits

Test apparatuses for semiconductor integrated circuits

by JEON JAE-KUK, SEO KI-MYUNG, BYUN DO-HOON
Year of Publication 22.06.2004

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Patent

TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUIT

TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUIT

by JEON JAE-KUK, SEO KI-MYUNG, BYUN DO-HOON
Year of Publication 30.07.2003

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Patent