by Gierak, J., Madouri, A., Biance, A.L., Bourhis, E., Patriarche, G., Ulysse, C., Lucot, D., Lafosse, X., Auvray, L., Bruchhaus, L., Jede, R.
Published in Microelectronic engineering (01.05.2007)

by Morin, A., Lucot, D., Ouerghi, A., Patriarche, G., Bourhis, E., Madouri, A., Ulysse, C., Pelta, J., Auvray, L., Jede, R., Bruchhaus, L., Gierak, J.
Published in Microelectronic engineering (01.09.2012)

by Bruchhaus, L., Bauerdick, S., Peto, L., Barth, U., Rudzinski, A., Mussmann, J., Klingfus, J., Gierak, J., Hövel, H.
Published in Microelectronic engineering (01.09.2012)

by Bauerdick, S., Sanabia, J. E., Mazarov, P., Fridmann, J., Bruchhaus, L., Jede, R.
Published in Microscopy and microanalysis (01.08.2014)

by Gierak, J., Bourhis, E., Faini, G., Patriarche, G., Madouri, A., Jede, R., Bruchhaus, L., Bauerdick, S., Schiedt, B., Biance, A.L., Auvray, L.
Published in Ultramicroscopy (01.04.2009)

by GIERAK, J, MAILLY, D, JAMET, J.-P, FERRE, J, MOUGIN, A, CHAPPERT, C, MATHET, V, WARIN, P, CHAPMAN, J, HAWKES, P, JEDE, R, BRUCHHAUS, L, BARDOTTI, L, PREVEL, B, MELINON, P, PEREZ, A, HYNDMAN, R
Published in Applied physics. A, Materials science & processing (2005)

by Gierak, J., Madouri, A., Biance, A.L., Bourhis, E., Patriarche, G., Ulysse, C., Lucot, D., Lafosse, X., Auvray, L., Bruchhaus, L., Jede, R.
Published in Microelectronic engineering (01.05.2007)

by Gierak, J., Bourhis, E., Mérat Combes, M.N., Chriqui, Y., Sagnes, I., Mailly, D., Hawkes, P., Jede, R., Bruchhaus, L., Bardotti, L., Prével, B., Hannour, A., Mélinon, P., Perez, A., Ferré, J., Jamet, J.-P., Mougin, A., Chappert, C., Mathet, V.
Published in Microelectronic engineering (01.03.2005)

by Gierak, J., Bourhis, E., Jede, R., Bruchhaus, L., Beaumont, B., Gibart, P.
Published in Microelectronic engineering (01.06.2004)

by Gierak, J, Schiedt, B, Lucot, D, Madouri, A, Bourhis, E, Patriarche, G, Ulysse, C, Lafosse, X, Auvray, L, Bruchhaus, L, Jede, R
Published in Microscopy and microanalysis (01.07.2009)

by GIERAK, J, BOURHIS, E, JEDE, R, BRUCHHAUS, L, BEAUMONT, B, GIBART, P
Published in Microelectronic engineering (01.06.2004)

by Bruchhaus, L., Mazarov, P., Bischoff, L., Gierak, J., Wieck, A. D., Hövel, H.
Published in Applied Physics Reviews (01.03.2017)

by Cramer, R.M., Bruchhaus, L., Balk, L.J.
Published in Microelectronics and reliability (01.10.1997)

by Ghaleh, F., Köster, R., Hövel, H., Bruchhaus, L., Bauerdick, S., Thiel, J., Jede, R.
Published in Journal of applied physics (15.02.2007)

by Ghaleh, F., Köster, R., Hövel, H., Bruchhaus, L., Bauerdick, S., Thiel, J., Jede, R.
Published in Journal of applied physics (16.02.2007)

by Gierak, J., Schiedt, B., Lucot, D., Madouri, A., Bourhis, E., Patriarche, G., Ulysse, C., Lafosse, X., Auvray, L., Bruchhaus, L., Jede, R.
Published in Microscopy today (01.09.2009)

by Torres, C.M.S., Hoffmann, T., Sidiki, T.P., Bruchhaus, L., Bruch, L.-U., Ahopelto, J., Schulz, H., Scheer, H.-C., Cardinaud, C., Pfeiffer, K.
Published in Conference on Lasers and Electro-Optics (CLEO 2000). Technical Digest. Postconference Edition. TOPS Vol.39 (IEEE Cat. No.00CH37088) (2000)