Transient Flow Boiling and Maldistribution Characteristics in Heated Parallel Channels Induced by Flow Regime Oscillations
Kingston, Todd A., Olson, Brian D., Weibel, Justin A., Garimella, Suresh V.
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.10.2021)
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.10.2021)
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Journal Article
Analysis of Parasitic PNP Bipolar Transistor Mitigation Using Well Contacts in 130 nm and 90 nm CMOS Technology
Olson, B.D., Amusan, O.A., Dasgupta, S., Massengill, L.W., Witulski, A.F., Bhuva, B.L., Alles, M.L., Warren, K.M., Ball, D.R.
Published in IEEE transactions on nuclear science (01.08.2007)
Published in IEEE transactions on nuclear science (01.08.2007)
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Journal Article
Leakage Current Degradation of Gallium Nitride Transistors Due to Heavy Ion Tests
Olson, Brian D., Ingalls, J. David, Rice, Casey H., Hedge, Casey C., Cole, Patrick L., Duncan, Adam R., Armstrong, Sarah E.
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
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Conference Proceeding
Heavy Ion Testing of Commercial GaN Transistors in the Radio Frequency Spectrum
Armstrong, Sarah E., Bole, Ken, Bradley, Holly, Johnson, Ethan, Staggs, James, Shedd, Walter, Cole, Patrick L., Rice, Casey H., Ingalls, J. David, Hedge, Casey C., Duncan, Adam R., Olson, Brian D.
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
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Conference Proceeding
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM
Warren, K.M., Weller, R.A., Mendenhall, M.H., Reed, R.A., Ball, D.R., Howe, C.L., Olson, B.D., Alles, M.L., Massengill, L.W., Schrimpf, R.D., Haddad, N.F., Doyle, S.E., McMorrow, D., Melinger, J.S., Lotshaw, W.T.
Published in IEEE transactions on nuclear science (01.12.2005)
Published in IEEE transactions on nuclear science (01.12.2005)
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Journal Article
Analysis of Single-Event Transients in Integer- N Frequency Dividers and Hardness Assurance Implications for Phase-Locked Loops
Loveless, T.D., Olson, B.D., Bhuva, B.L., Holman, W.T., Hafer, C.C., Massengill, L.W.
Published in IEEE transactions on nuclear science (01.12.2009)
Published in IEEE transactions on nuclear science (01.12.2009)
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Journal Article
Single-Event Effect Mitigation in Switched-Capacitor Comparator Designs
Olson, Brian D., Holman, W. Timothy, Massengill, Lloyd W., Bhuva, Bharat L., Fleming, Patrick R.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Evaluation of Radiation-Hardened Design Techniques Using Frequency Domain Analysis
Olson, B.D., Holman, W.T., Massengill, L.W., Bhuva, B.L.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Comparison of various transport media on human periodontal ligament cell viability
Olson, Brian D., Mailhot, Jason M., Anderson, Ronald W., Schuster, George S., Weller, R. Norman
Published in Journal of endodontics (01.11.1997)
Published in Journal of endodontics (01.11.1997)
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Journal Article