SETTING UP INSPECTION OF A SPECIMEN
CHEN, Hong, BRAUER, Bjorn, PARK, Sangbong, LI, Xiaochun, SEZGINER, Abdurrahman, GE, Cong
Year of Publication 03.03.2022
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Year of Publication 03.03.2022
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Repeater defect detection
Brauer, Bjorn, Mathew, Ashok, Sen, Sumit, Gao, Lisheng, Chandrasekaran, Sreeram, Shifrin, Eugene
Year of Publication 21.12.2021
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Year of Publication 21.12.2021
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Defect-location determination using correction loop for pixel alignment
Brauer, Bjorn, Li, Xiaochun, Bhattacharyya, Santosh, Lee, Hucheng, Park, Sangbong, Singh, Tarunark, Dowling, David, Mantiply, Bryant
Year of Publication 29.06.2021
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Year of Publication 29.06.2021
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Data augmentation for convolutional neural network-based defect inspection
Brauer, Bjorn, Ramachandran, Vijay, Wallingford, Richard, Young, Scott Allen
Year of Publication 03.09.2019
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Year of Publication 03.09.2019
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Clustering Sub-Care Areas Based on Noise Characteristics
Soltanmohammadi, Erfan, Brauer, Bjorn, Tumakov, Vladimir, Lee, Hucheng, Huang, Boshi, Park, Sangbong
Year of Publication 27.05.2021
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Year of Publication 27.05.2021
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CLUSTERING SUB-CARE AREAS BASED ON NOISE CHARACTERISTICS
BRAUER, Bjorn, HUANG, Boshi, SOLTANMOHAMMADI, Erfan, PARK, Sangbong, LEE, Hucheng, TUMAKOV, Vladimir
Year of Publication 27.05.2021
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Year of Publication 27.05.2021
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UNSUPERVISED LEARNING-BASED REFERENCE SELECTION FOR ENHANCED DEFECT INSPECTION SENSITIVITY
PATWARY, Nurmohammed, BRAUER, Bjorn, LI, Xiaochun, PARK, Sean Sangbong
Year of Publication 01.04.2021
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Year of Publication 01.04.2021
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Optical-mode selection for multi-mode semiconductor inspection
PARK, SANGBONG, LEE, HUCHENG, GRAMA, KEDAR, WALLINGFORD, RICHARD, BRAUER, BJORN
Year of Publication 01.03.2024
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Year of Publication 01.03.2024
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Defect sensitivity of semiconductor wafer inspectors using design data with wafer image data
Banerjee, Saibal, Brauer, Bjorn, Bhattacharyya, Santosh, Kulkarni, Ashok
Year of Publication 13.11.2018
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Year of Publication 13.11.2018
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