Improvements to Statistical Characterization and Modeling, and a Caution to be Aware of Spurious Correlation in Statistical Simulation
McAndrew, Colin C., Hoseini, Mariam, Braswell, Brandt, Garrity, Doug A.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.07.2023)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.07.2023)
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Journal Article
High-performance analog/mixed-signal characterization techniques
Garrity, Doug, Braswell, Brandt
Published in Proceedings of the IEEE 2014 Custom Integrated Circuits Conference (01.09.2014)
Published in Proceedings of the IEEE 2014 Custom Integrated Circuits Conference (01.09.2014)
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Conference Proceeding
A Self-Amplifying Four-Transistor MOSFET Mismatch Test Structure
McAndrew, Colin C., Zunino, Mike, Braswell, Brandt
Published in IEEE transactions on semiconductor manufacturing (01.08.2013)
Published in IEEE transactions on semiconductor manufacturing (01.08.2013)
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Journal Article
Conference Proceeding
Corner models: Inaccurate at best, and it only gets worst
McAndrew, Colin C., Lim, Ik-Sung, Braswell, Brandt, Garrity, Doug
Published in Proceedings of the IEEE 2013 Custom Integrated Circuits Conference (01.09.2013)
Published in Proceedings of the IEEE 2013 Custom Integrated Circuits Conference (01.09.2013)
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Conference Proceeding
Self-biasing and self-amplifying MOSFET mismatch test structure
McAndrew, C. C., Zunino, M., Braswell, B.
Published in 2012 IEEE International Conference on Microelectronic Test Structures (01.03.2012)
Published in 2012 IEEE International Conference on Microelectronic Test Structures (01.03.2012)
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Conference Proceeding