Effect of build orientation on the mechanical reliability of 3D printed ABS
Keleş, Özgür, Blevins, Caleb Wayne, Bowman, Keith J
Published in Rapid prototyping journal (01.01.2017)
Published in Rapid prototyping journal (01.01.2017)
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Journal Article
Domain wall motion and electromechanical strain in lead-free piezoelectrics: Insight from the model system (1 − x)Ba(Zr0.2Ti0.8)O3–x(Ba0.7Ca0.3)TiO3 using in situ high-energy X-ray diffraction during application of electric fields
Tutuncu, Goknur, Li, Binzhi, Bowman, Keith, Jones, Jacob L.
Published in Journal of applied physics (14.04.2014)
Published in Journal of applied physics (14.04.2014)
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Journal Article
A Unified Clock and Switched-Capacitor-Based Power Delivery Architecture for Variation Tolerance in Low-Voltage SoC Domains
Rahman, Fahim ur, Kim, Sung, John, Naveen, Kumar, Roshan, Li, Xi, Pamula, Rajesh, Bowman, Keith A., Sathe, Visvesh S.
Published in IEEE journal of solid-state circuits (01.04.2019)
Published in IEEE journal of solid-state circuits (01.04.2019)
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Journal Article
Temperature-Dependent Poling Behavior of Lead-free BZT-BCT Piezoelectrics
Li, Binzhi, Blendell, John E., Bowman, Keith J.
Published in Journal of the American Ceramic Society (01.10.2011)
Published in Journal of the American Ceramic Society (01.10.2011)
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Journal Article
Resolving structural contributions to the electric-field-induced strain in lead-free (1−x)Ba(Zr0.2Ti0.8)O3−x(Ba0.7Ca0.3)TiO3 piezoceramics
Ehmke, Matthias C., Khansur, Neamul H., Daniels, John E., Blendell, John E., Bowman, Keith J.
Published in Acta materialia (01.03.2014)
Published in Acta materialia (01.03.2014)
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Journal Article
Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance
Bowman, K.A., Tschanz, J.W., Nam Sung Kim, Lee, J.C., Wilkerson, C.B., Lu, S.-L.L., Karnik, T., De, V.K.
Published in IEEE journal of solid-state circuits (01.01.2009)
Published in IEEE journal of solid-state circuits (01.01.2009)
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Journal Article
Conference Proceeding
High Bipolar Fatigue Resistance of BCTZ Lead-Free Piezoelectric Ceramics
Zhang, Yichi, Glaum, Julia, Ehmke, Matthias C., Blendell, John E., Bowman, Keith J., Hoffman, Mark J.
Published in Journal of the American Ceramic Society (01.01.2016)
Published in Journal of the American Ceramic Society (01.01.2016)
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Journal Article
Unipolar Fatigue Behavior of BCTZ Lead-Free Piezoelectric Ceramics
Zhang, Yichi, Glaum, Julia, Ehmke, Matthias C., Bowman, Keith J., Blendell, John E., Hoffman, Mark J.
Published in Journal of the American Ceramic Society (01.04.2016)
Published in Journal of the American Ceramic Society (01.04.2016)
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Journal Article
A 45 nm Resilient Microprocessor Core for Dynamic Variation Tolerance
Bowman, K A, Tschanz, J W, Lu, S L, Aseron, P A, Khellah, M M, Raychowdhury, A, Geuskens, B M, Tokunaga, C, Wilkerson, C B, Karnik, T, De, V K
Published in IEEE journal of solid-state circuits (01.01.2011)
Published in IEEE journal of solid-state circuits (01.01.2011)
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Journal Article
Conference Proceeding
A 22 nm All-Digital Dynamically Adaptive Clock Distribution for Supply Voltage Droop Tolerance
Bowman, K. A., Tokunaga, C., Karnik, T., De, V. K., Tschanz, J. W.
Published in IEEE journal of solid-state circuits (01.04.2013)
Published in IEEE journal of solid-state circuits (01.04.2013)
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Journal Article
Conference Proceeding
Within-Die Variation-Aware Dynamic-Voltage-Frequency-Scaling With Optimal Core Allocation and Thread Hopping for the 80-Core TeraFLOPS Processor
Dighe, S, Vangal, S R, Aseron, P, Kumar, S, Jacob, T, Bowman, K A, Howard, J, Tschanz, J, Erraguntla, V, Borkar, N, De, V K, Borkar, S
Published in IEEE journal of solid-state circuits (01.01.2011)
Published in IEEE journal of solid-state circuits (01.01.2011)
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Journal Article
Conference Proceeding
Texture and Anisotropy of Polycrystalline Piezoelectrics
Jones, Jacob L., Iverson, Benjamin J., Bowman, Keith J.
Published in Journal of the American Ceramic Society (01.08.2007)
Published in Journal of the American Ceramic Society (01.08.2007)
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Journal Article
A 16 nm All-Digital Auto-Calibrating Adaptive Clock Distribution for Supply Voltage Droop Tolerance Across a Wide Operating Range
Bowman, Keith A., Raina, Sarthak, Bridges, J. Todd, Yingling, Daniel J., Nguyen, Hoan H., Appel, Brad R., Kolla, Yesh N., Jihoon Jeong, Atallah, Francois I., Hansquine, David W.
Published in IEEE journal of solid-state circuits (01.01.2016)
Published in IEEE journal of solid-state circuits (01.01.2016)
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Journal Article