Reliability behavior of GaN HEMTs related to Au diffusion at the Schottky interface
Jung, Helmut, Behtash, Reza, Thorpe, James R., Riepe, Klaus, Bourgeois, Franck, Blanck, Hervé, Chuvilin, Andrey, Kaiser, Ute
Published in Physica status solidi. C (01.06.2009)
Published in Physica status solidi. C (01.06.2009)
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Journal Article
Investigation of Leakage Current of AlGaN/GaN HEMTs Under Pinch-Off Condition by Electroluminescence Microscopy
Baeumler, Martina, Gütle, Frank, Polyakov, Vladimir, Cäsar, Markus, Dammann, Michael, Konstanzer, Helmer, Pletschen, Wilfried, Bronner, Wolfgang, Quay, Rüdiger, Waltereit, Patrick, Mikulla, Michael, Ambacher, Oliver, Bourgeois, Franck, Behtash, Reza, Riepe, Klaus J., van der Wel, Paul J., Klappe, Jos, Rödle, Thomas
Published in Journal of electronic materials (01.06.2010)
Published in Journal of electronic materials (01.06.2010)
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Journal Article
Industrial GaN FET technology
Blanck, Hervé, Thorpe, James R., Behtash, Reza, Splettstößer, Jörg, Brückner, Peter, Heckmann, Sylvain, Jung, Helmut, Riepe, Klaus, Bourgeois, Franck, Hosch, Michael, Köhn, Dominik, Stieglauer, Hermann, Floriot, Didier, Lambert, Benoît, Favede, Laurent, Ouarch, Zineb, Camiade, Marc
Published in International journal of microwave and wireless technologies (01.02.2010)
Published in International journal of microwave and wireless technologies (01.02.2010)
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Journal Article
Investigation of Leakage Current of AIGaN/GaN HEMTs Under Pinch-Off Condition by Electroluminescence Microscopy
BAEUMLER, Martina, GÜTLE, Frank, MIKULLA, Michael, AMBACHER, Oliver, BOURGEOIS, Franck, BEHTASH, Reza, RIEPE, Klaus J, VAN DER WEL, Paul J, KLAPPE, Jos, RÖDLE, Thomas, POLYAKOV, Vladimir, CÄSAR, Markus, DAMMANN, Michael, KONSTANZER, Helmer, PLETSCHEN, Wilfried, BRONNER, Wolfgang, QUAY, Rüdiger, WALTEREIT, Patrick
Published in Journal of electronic materials (2010)
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Published in Journal of electronic materials (2010)
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