Skin alcohol perspiration measurements using MOX sensors
Lawson, B., Aguir, K., Fiorido, T., Martini-Laithier, V., Bouchakour, R., Burtey, S., Reynard-Carette, Ch, Bendahan, M.
Published in Sensors and actuators. B, Chemical (01.02.2019)
Published in Sensors and actuators. B, Chemical (01.02.2019)
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Journal Article
Dual-control-gate floating gate transistor: a building block for circuit design
Marzaki, A, Bidal, V, Laffont, R, Rahajandraibe, W, Portal, J-M, Bouchakour, R
Published in Electronics letters (29.09.2011)
Published in Electronics letters (29.09.2011)
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Journal Article
Jitter-free return-to-zero generator
HARDY, E, IHS, H, DUFAZA, C, MEILLERE, S, BOUCHAKOUR, R
Published in Electronics letters (26.05.2011)
Published in Electronics letters (26.05.2011)
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Journal Article
Dual-control-gate floating gate transistor: a building block for circuit design
MARZAKI, A, BIDAL, V, LAFFONT, R, RAHAJANDRAIBE, W, PORTAL, J.-M, BOUCHAKOUR, R
Published in Electronics letters (29.09.2011)
Published in Electronics letters (29.09.2011)
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Journal Article
Modeling charge variation during data retention of MLC Flash memories
Postel-Pellerin, J., Lalande, F., Canet, P., Bouchakour, R., Jeuland, F., Morancho, L.
Published in Microelectronics and reliability (01.09.2009)
Published in Microelectronics and reliability (01.09.2009)
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Journal Article
Conference Proceeding
New EEPROM concept for single bit operation
Raguet, J.R., Laffont, R., Bouchakour, R., Bidal, V., Regnier, A., Mirabel, J.M.
Published in Solid-state electronics (01.10.2008)
Published in Solid-state electronics (01.10.2008)
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Journal Article
Conference Proceeding
Extraction of 3D parasitic capacitances in 90 nm and 22 nm NAND flash memories
Postel-Pellerin, J., Lalande, F., Canet, P., Bouchakour, R., Jeuland, F., Bertello, B., Villard, B.
Published in Microelectronics and reliability (2009)
Published in Microelectronics and reliability (2009)
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Journal Article
Conference Proceeding
NMOS electrical model for halo implant study
Regnier, A., Portal, J.M., Bouchakour, R.
Published in Journal of non-crystalline solids (01.04.2007)
Published in Journal of non-crystalline solids (01.04.2007)
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Journal Article
Conference Proceeding
Tunneling injection temperature dependence in EEPROM cell
Zahi, Y., Laffont, R., Lalande, F., Boutahar, S., Bouchakour, R.
Published in Journal of non-crystalline solids (01.04.2007)
Published in Journal of non-crystalline solids (01.04.2007)
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Journal Article
Conference Proceeding
New Schmitt Trigger with Controllable Hysteresis using Dual Control Gate-Floating Gate Transistor (DCG-FGT)
Marzaki, Abderrezak, Bidal, V, Laffont, R, Rahajandraibe, W, Portal, J-M, Bouchakour, R
Published in International journal of reconfigurable and embedded systems (01.03.2013)
Published in International journal of reconfigurable and embedded systems (01.03.2013)
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Journal Article
Extraction of 3D parasitic capacitances in 90nm and 22nm NAND flash memories
Postel-Pellerin, J., Lalande, F., Canet, P., Bouchakour, R., Jeuland, F., Bertello, B., Villard, B.
Published in Microelectronics and reliability (01.09.2009)
Published in Microelectronics and reliability (01.09.2009)
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Journal Article
CHE and CHISEL characterization procedure for compact Flash cell model
Régnier, A., Saillet, B., Portal, J.M., Bouchakour, R.
Published in Journal of non-crystalline solids (01.04.2007)
Published in Journal of non-crystalline solids (01.04.2007)
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Journal Article
Conference Proceeding
Impact of stress on Fowler–Nordheim parameters effects on EEPROM threshold voltage
Postel-Pellerin, J., Lalande, F., Canet, P., Boutahar, S., Bouchakour, R., Pizzuto, O., Régnier, A.
Published in Journal of non-crystalline solids (01.04.2007)
Published in Journal of non-crystalline solids (01.04.2007)
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Journal Article
Conference Proceeding
Temperature and drain voltage dependence of gate-induced drain leakage
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Journal Article
Conference Proceeding
A new architecture of dual control gate EEPROM
Regnier, A., Laffont, R., Bouchakour, R., Mirabel, J.M.
Published in Journal of non-crystalline solids (15.07.2005)
Published in Journal of non-crystalline solids (15.07.2005)
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Journal Article
Conference Proceeding
Deterioration of stressed oxides: Application to the prediction of a non-volatile memory cell endurance
Razafindramora, J., Canet, P., Lalande, F., Bouchakour, R., Boivin, P., Mirabel, J.-M.
Published in Journal of non-crystalline solids (15.07.2005)
Published in Journal of non-crystalline solids (15.07.2005)
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Journal Article
Conference Proceeding
Design and Analysis of a Gilbert Analog Multiplier for Input Dynamic Range optimization
Vauche, R., Benjelloun, Z., Mefteh, R. Assila Belhadj, Rahajandraibe, W., Bouchakour, R., Barthelemy, H.
Published in 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS) (01.04.2020)
Published in 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS) (01.04.2020)
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Conference Proceeding
Non-volatile memory cell design: Coupling ratio impact on tunnel oxide reliability
Bouquet, V., Canet, P., Lalande, F., Bouchakour, R., Mirabel, J.M.
Published in Journal of non-crystalline solids (15.07.2005)
Published in Journal of non-crystalline solids (15.07.2005)
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Journal Article
Conference Proceeding
EEPROM cell design: paradoxical choice of the coupling ratio
Canet, P., Bouchakour, R., Lalande, F., Mirabel, J.M.
Published in Journal of non-crystalline solids (15.07.2003)
Published in Journal of non-crystalline solids (15.07.2003)
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Journal Article
Conference Proceeding
A new floating gate compact model applied to flash memory cell
Laffont, R., Masson, P., Bernardini, S., Bouchakour, R., Mirabel, J.M.
Published in Journal of non-crystalline solids (15.07.2003)
Published in Journal of non-crystalline solids (15.07.2003)
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Conference Proceeding