Electrical Conductivity Discontinuity at Melt in Phase Change Memory
Crespi, Luca, Ghetti, Andrea, Boniardi, Mattia, Lacaita, Andrea L.
Published in IEEE electron device letters (01.07.2014)
Published in IEEE electron device letters (01.07.2014)
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Impact of Ge–Sb–Te compound engineering on the set operation performance in phase-change memories
Boniardi, Mattia, Ielmini, Daniele, Tortorelli, Innocenzo, Redaelli, Andrea, Pirovano, Agostino, Allegra, Mario, Magistretti, Michele, Bresolin, Camillo, Erbetta, Davide, Modelli, Alberto, Varesi, Enrico, Pellizzer, Fabio, Lacaita, Andrea L., Bez, Roberto
Published in Solid-state electronics (01.04.2011)
Published in Solid-state electronics (01.04.2011)
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메모리 디바이스들에 퓨즈 데이터를 저장하기 위한 구현예들
ALLEGRA MARIO, ROBUSTELLI MATTIA, BONIARDI MATTIA, CONTI ANNA MARIA, TORTORELLI INNOCENZO
Year of Publication 11.03.2022
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Year of Publication 11.03.2022
Patent
메모리 디바이스를 위한 적응적 기록 동작들
ALLEGRA MARIO, ROBUSTELLI MATTIA, BONIARDI MATTIA, TORTORELLI INNOCENZO, DODGE RICHARD K
Year of Publication 11.03.2022
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Year of Publication 11.03.2022
Patent
Study of Cycling-Induced Parameter Variations in Phase Change Memory Cells
Boniardi, Mattia, Redaelli, Andrea, Ghetti, Andrea, Lacaita, Andrea L.
Published in IEEE electron device letters (01.07.2013)
Published in IEEE electron device letters (01.07.2013)
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Journal Article
Internal Temperature Extraction in Phase-Change Memory Cells During the Reset Operation
Boniardi, M., Redaelli, A., Tortorelli, I., Pellizzer, F., Pirovano, A.
Published in IEEE electron device letters (01.04.2012)
Published in IEEE electron device letters (01.04.2012)
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Journal Article