by Ioannou, D P, Zhao, K, Bansal, A, Linder, B, Bolam, R, Cartier, E, Kim, J, Rao, R, La Rosa, G, Massey, G, Hauser, M, Das, K, Stathis, J H, Aitken, J, Badami, D, Mittl, S
Published in 2011 International Reliability Physics Symposium (01.04.2011)

by Stathis, J.H., Bolam, R., Yang, M., Hook, T.B., Chou, A., Larosa, G.
Published in Microelectronic engineering (01.06.2005)

by Bolam, Michael R., Corbett, Lauren E., Ellero, Nadine P., Stein Kenfield, Ayla, Mitchell, Erik T., Opasik, Scott A., Ryszka, Deborah
Published in Technical services quarterly (02.10.2018)

by Hook, T B, Burnham, J S, Bolam, R J
Published in IBM journal of research and development (01.05.1999)

by Wu, E., Lai, W., Khare, M., Sune, J., Han, L.-K., McKenna, J., Bolam, R., Harmon, D., Strong, A.
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)

by Mena-Segovia, J., Micklem, B.R., Nair-Roberts, R.G., Ungless, M.A., Bolam, J.P.
Published in Journal of comparative neurology (1911) (01.08.2009)

by Adusumilli, P., Alptekin, E., Raymond, M., Breil, N., Chafik, F., Lavoie, C., Ferrer, D., Jain, S., Kamineni, V., Ozcan, A., Allen, S., An, J. J., Basker, V., Bolam, R., Bu, H., Cai, J., Demarest, J., Doris, B., Engbrecht, E., Fan, S., Fronheiser, J., Gluschenkov, O., Guo, D., Haran, B., Hilscher, D., Jagannathan, H., Kang, D., Ke, Y., Kim, J., Koswatta, S., Kumar, A., Labonte, A., Lallement, R., Lee, W., Lee, Y., Li, J., Lin, C.-H, Liu, B., Liu, Z., Loubet, N., Makela, N., Mochizuki, S., Morgenfeld, B., Narasimha, S., Nesheiwat, T., Niimi, H., Niu, C., Oh, M., Park, C., Ramachandran, R., Rice, J., Sardesai, V., Shearer, J., Sheraw, C., Tran, C., Tsutsui, G., Utomo, H., Wong, K., Xie, R., Yamashita, T., Yan, Y., Yeh, C., Yu, M., Zamdmer, N., Zhan, N., Zhang, B., Paruchuri, V., Goldberg, C., Kleemeier, W., Stiffler, S., Divakaruni, R., Henson, W.
Published in 2016 IEEE Symposium on VLSI Technology (01.06.2016)

by Vaed, K., Eshun, E., Bolam, R., Stein, K., Coolbaugh, D., Ahlgren, D., Dunn, J.
Published in Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004 (2004)

by Bolam, R. Mason, Hepworth, R., Bowerman, L. T.
Published in British Medical Journal (29.05.1971)

by Ketchen, M.B., Bhushan, M., Bolam, R.
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)

by Bolam, R. F.
Published in Postgraduate medical journal (01.01.1960)

by Bolam, R J, Ramachandran, V, Coolbaugh, D, Watson, K M
Published in IEEE transactions on electron devices (01.04.2003)

by Bolam, R. F.
Published in British Medical Journal (13.03.1965)

by Bolam, R. Mason
Published in British Medical Journal (20.10.1945)

by Bolam, R. F.
Published in British Medical Journal (09.02.1957)

by Bolam, R. F.
Published in British Medical Journal (29.10.1955)

by Bolam, R. F.
Published in British Medical Journal (03.01.1959)

by Bolam, R. F.
Published in British Medical Journal (24.07.1954)

by Bolam, R. Mason
Published in British Medical Journal (04.12.1954)

by Bolam, R., Shahidi, G., Assaderaghi, F., Khare, M., Mocuta, A., Hook, T., Wu, E., Leobandung, E., Voldman, S., Badami, D.
Published in International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) (2000)