Interplay Between Process-Induced and Statistical Variability in 14-nm CMOS Technology Double-Gate SOI FinFETs
Xingsheng Wang, Binjie Cheng, Brown, Andrew Robert, Millar, Campbell, Kuang, Jente B., Nassif, Sani, Asenov, Asen
Published in IEEE transactions on electron devices (01.08.2013)
Published in IEEE transactions on electron devices (01.08.2013)
Get full text
Journal Article
Extended Analysis of the Z^ -FET: Operation as Capacitorless eDRAM
Navarro, Carlos, Lacord, Joris, Singh Parihar, Mukta, Adamu-Lema, Fikru, Meng Duan, Rodriguez, Noel, Binjie Cheng, El Dirani, Hassan, Barbe, Jean-Charles, Fonteneau, Pascal, Bawedin, Maryline, Millar, Campbell, Galy, Philippe, Le Royer, Cyrille, Karg, Siegfried, Wells, Paul, Yong-Tae Kim, Asenov, Asen, Cristoloveanu, Sorin, Gamiz, Francisco
Published in IEEE transactions on electron devices (01.11.2017)
Published in IEEE transactions on electron devices (01.11.2017)
Get full text
Journal Article
Accurate Simulation of Transistor-Level Variability for the Purposes of TCAD-Based Device-Technology Cooptimization
Gerrer, Louis, Brown, Andrew R., Millar, Campbell, Hussin, Razaidi, Amoroso, Salvatore Maria, Binjie Cheng, Reid, Dave, Alexander, Craig, Fried, David, Hargrove, Michael, Greiner, Ken, Asenov, Asen
Published in IEEE transactions on electron devices (01.06.2015)
Published in IEEE transactions on electron devices (01.06.2015)
Get full text
Journal Article
Predictive Simulation and Benchmarking of Si and Ge pMOS FinFETs for Future CMOS Technology
Shifren, Lucian, Aitken, Robert, Brown, Andrew R., Chandra, Vikas, Binjie Cheng, Riddet, Craig, Alexander, Craig L., Cline, Brian, Millar, Campbell, Sinha, Saurabh, Yeric, Greg, Asenov, Asen
Published in IEEE transactions on electron devices (01.07.2014)
Published in IEEE transactions on electron devices (01.07.2014)
Get full text
Journal Article
Hierarchical Simulation of Statistical Variability: From 3-D MC With " ab initio" Ionized Impurity Scattering to Statistical Compact Models
Kovac, Urban, Alexander, Craig, Roy, Gareth, Riddet, Craig, Binjie Cheng, Asenov, Asen
Published in IEEE transactions on electron devices (01.10.2010)
Published in IEEE transactions on electron devices (01.10.2010)
Get full text
Journal Article
Performance and Variability of Doped Multithreshold FinFETs for 10-nm CMOS
Adamu-Lema, Fikru, Xingsheng Wang, Amoroso, Salvatore Maria, Riddet, Craig, Binjie Cheng, Shifren, Lucian, Aitken, Robert, Sinha, Saurahb, Yeric, Greg, Asenov, Asen
Published in IEEE transactions on electron devices (01.10.2014)
Published in IEEE transactions on electron devices (01.10.2014)
Get full text
Journal Article
New Assessment Methodology Based on Energy-Delay-Yield Cooptimization for Nanoscale CMOS Technology
Jiang, Xiaobo, Wang, Junyao, Wang, Xingsheng, Wang, Runsheng, Cheng, Binjie, Asenov, Asen, Wei, Lan, Huang, Ru
Published in IEEE transactions on electron devices (01.06.2015)
Published in IEEE transactions on electron devices (01.06.2015)
Get full text
Journal Article
FET as Capacitor-Less eDRAM Cell For High-Density Integration
Navarro, Carlos, Meng Duan, Singh Parihar, Mukta, Adamu-Lema, Fikru, Coseman, Stefan, Lacord, Joris, Kyunghwa Lee, Sampedro, Carlos, Binjie Cheng, El Dirani, Hassan, Barbe, Jean-Charles, Fonteneau, Pascal, Seong-Il Kim, Cristoloveanu, Sorin, Bawedin, Maryline, Millar, Campbell, Galy, Philippe, Le Royer, Cyrille, Karg, Siegfried, Riel, Heike, Wells, Paul, Yong-Tae Kim, Asenov, Asen, Gamiz, Francisco
Published in IEEE transactions on electron devices (01.12.2017)
Published in IEEE transactions on electron devices (01.12.2017)
Get full text
Journal Article
Back-Gate Bias Dependence of the Statistical Variability of FDSOI MOSFETs With Thin BOX
Yunxiang Yang, Markov, S., Binjie Cheng, Zain, A. S. M., Xiaoyan Liu, Asen Cheng
Published in IEEE transactions on electron devices (01.02.2013)
Published in IEEE transactions on electron devices (01.02.2013)
Get full text
Journal Article
Comprehensive study of the statistical variability in a 22 nm fully depleted ultra-thin-body SOI MOSFET
ANIS SUHAILA MOHD ZAIN, MARKOV, Stanislav, BINJIE CHENG, ASENOV, Asen
Published in Solid-state electronics (01.12.2013)
Published in Solid-state electronics (01.12.2013)
Get full text
Conference Proceeding
Journal Article
Optimal DC-segmentation for multi-infeed HVDC systems based on stability performance
Binjie Cheng, Zheng Xu, Wei Xu
Published in 2016 IEEE Power and Energy Society General Meeting (PESGM) (01.07.2016)
Published in 2016 IEEE Power and Energy Society General Meeting (PESGM) (01.07.2016)
Get full text
Conference Proceeding