Design for test (DFT) read speed through transition detector in built-in self-test (BIST) sort
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Year of Publication 24.02.2015
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Year of Publication 24.02.2015
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DESIGN FOR TEST (DFT) READ SPEED THROUGH TRANSITION DETECTOR IN BUILT-IN SELF-TEST (BIST) SORT
TEOH, BOON-WENG, ONG, WEI-KENT, ONG, MEEOO, BEH, JIH, HONG, CH'NG, SHEAU-YANG, LAU, SIE WEI, HENRY
Year of Publication 28.08.2014
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Year of Publication 28.08.2014
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DESIGN FOR TEST (DFT) READ SPEED THROUGH TRANSITION DETECTOR IN BUILT-IN SELF-TEST (BIST) SORT
TEOH, BOON-WENG, CH'NG,, SHEAU-YANG, ONG, WEI-KENT, ONG, MEEOO, BEH, JIH, HONG, LAU, SIE WEI, HENRY
Year of Publication 03.07.2014
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Year of Publication 03.07.2014
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DESIGN FOR TEST (DFT) READ SPEED THROUGH TRANSITION DETECTOR IN BUILT-IN SELF-TEST (BIST) SORT
CH'NG SHEAU-YANG, ONG WEI-KENT, LAU SIE WEI HENRY, TEOH BOON-WENG, ONG MEEOO, BEH JIH HONG
Year of Publication 03.07.2014
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Year of Publication 03.07.2014
Patent