Impact of the recessed gate depth on the GaN metal-oxide-semiconductor high electron mobility transistor performances: New insights on mobility extraction
Piotrowicz, C., Mohamad, B., Malbert, N., Bécu, S., Ruel, S., Le Royer, C.
Published in Journal of applied physics (07.05.2024)
Published in Journal of applied physics (07.05.2024)
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Journal Article
New insights into low frequency noise (LFN) sources analysis in GaN/Si MIS-HEMTs
Kom Kammeugne, R., Theodorou, C., Leroux, C., Vauche, L., Mescot, X., Gwoziecki, R., Becu, S., Charles, M., Bano, E., Ghibaudo, G.
Published in Solid-state electronics (01.02.2023)
Published in Solid-state electronics (01.02.2023)
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Journal Article
Quantifying the wind dispersal of Culicoides species in Greece and Bulgaria
Ducheyne, E, De Deken, R, Bécu, S, Codina, B, Nomikou, K, Mangana-Vougiaki, O, Georgiev, G, Purse, B V, Hendickx, G
Published in Geospatial health (01.05.2007)
Published in Geospatial health (01.05.2007)
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Journal Article
Capacitance non-linearity study in Al2O3 MIM capacitors using an ionic polarization model
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Conference Proceeding
Journal Article
Dry Etch Challenges in Gate All Around Devices for sub 32 nm Applications
Barnola, Sebastien, Vizioz, Christian, Vulliet, Nathalie, Dupré, Cécilia, Ernst, Thomas, Gautier, Pauline, Arvet, Christian, Guillaumot, Bernard, Bernard, Emilie, Pauliac-Vaujeour, S., Comboroure, Corine, Hartmann, Jean-Michel, Borel, Stephan, Chevolleau, Thierry, Maffini-Alvaro, V, Becu, S
Published in ECS transactions (2009)
Published in ECS transactions (2009)
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Journal Article
Deep Insights into Recessed Gate MOS-HEMT Technology for Power Applications
Mohamad, B., Royer, C. Le, Rigaud-Minet, F., Piotrowicz, C., Paes Pinto Rocha, P. Fernandes, Leurquin, C., Vandendaele, W., Escoffier, R., Buckley, J., Becu, S., Biscarrat, J., Gwoziecki, R.
Published in 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (07.03.2023)
Published in 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (07.03.2023)
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Conference Proceeding
Electrical properties in low temperature range (5 K–300 K) of Tantalum Oxide dielectric MIM capacitors
Deloffre, E., Montès, L., Ghibaudo, G., Bruyère, S., Blonkowski, S., Bécu, S., Gros-Jean, M., Crémer, S.
Published in Microelectronics and reliability (01.05.2005)
Published in Microelectronics and reliability (01.05.2005)
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Journal Article
Conference Proceeding
Analytical modeling of Accumulation-Mode Suspended-Gate MOSFET and process challenges for very low operating power devices
Collonge, M., Vinet, M., Ribeiro, M., Pedini, J.-M., Previtali, B., Ernst, T., Becu, S., Ghibaudo, G.
Published in 2009 International Symposium on VLSI Technology, Systems, and Applications (01.04.2009)
Published in 2009 International Symposium on VLSI Technology, Systems, and Applications (01.04.2009)
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Conference Proceeding
3D multichannels and stacked nanowires technologies for new design opportunities in nanoelectronics
Ernst, T., Bernard, E., Dupre, C., Hubert, A., Becu, S., Guillaumot, B., Rozeau, O., Thomas, O., Coronel, P., Hartmann, J.-M., Vizioz, C., Vulliet, N., Faynot, O., Skotnicki, T., Deleonibus, S.
Published in 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial (01.06.2008)
Published in 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial (01.06.2008)
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Conference Proceeding
High Performances 3D Damascene MIM Capacitors Integrated in Copper Back-End Technologies
Cremer, S., Richard, C., Benoit, D., Besset, C., Manceau, J.P., Farcy, A., Perrot, C., Segura, N., Marin, M., Becu, S., Boret, S., Thomas, M., Guillaumet, S., Bonnard, A., Delpech, P., Bruyere, S.
Published in 2006 Bipolar/BiCMOS Circuits and Technology Meeting (01.10.2006)
Published in 2006 Bipolar/BiCMOS Circuits and Technology Meeting (01.10.2006)
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Conference Proceeding
Thorough Investigation of Low Frequency Noise Mechanisms in AlGaN/GaN and Al2O3/GaN HEMTs
Kammeugne, R. Kom, Theodorou, C., Leroux, C., Mescot, X., Vauche, L., Gwoziecki, R., Becu, S., Charles, M., Bano, E., Ghibaudo, G.
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)
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Conference Proceeding
15nm-diameter 3D stacked nanowires with independent gates operation: ΦFET
Dupre, C., Hubert, A., Becu, S., Jublot, M., Maffini-Alvaro, V., Vizioz, C., Aussenac, F., Arvet, C., Barnola, S., Hartmann, J.-M., Garnier, G., Allain, F., Colonna, J.-P., Rivoire, M., Baud, L., Pauliac, S., Loup, V., Chevolleau, T., Rivallin, P., Guillaumot, B., Ghibaudo, G., Faynot, O., Ernst, T., Deleonibus, S.
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
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Conference Proceeding
Novel Si-based nanowire devices: Will they serve ultimate MOSFETs scaling or ultimate hybrid integration?
Ernst, T., Duraffourg, L., Dupre, C., Bernard, E., Andreucci, P., Becu, S., Ollier, E., Hubert, A., Halte, C., Buckley, J., Thomas, O., Delapierre, G., Deleonibus, S., de Salvo, B., Robert, P., Faynot, O.
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
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Conference Proceeding
3D Suspended Nanowires Integration for CMOS and Beyond
Ernst, Thomas, Tachi, Kiichi, Hubert, Alexandre, Saracco, Emeline, Dupré, Cécilia, Bécu, Stéphane, Vulliet, Nathalie, Bernard, Emilie, Cherns, Peter, Maffini-Alvaro, Virginie, Damlencourt, Jean-François, Vizioz, Christian, Colonna, Jean-Philippe, Bonafos, Caroline, Hartmann, Jean-Michel
Published in ECS transactions (25.09.2009)
Published in ECS transactions (25.09.2009)
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Journal Article
Characterization and modeling of Al/sub 2/O/sub 3/ MIM capacitors: temperature and electrical field effects
Becu, S., Cremer, S., Noblanc, O., Autran, J.-L., Delpech P
Published in Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005 (2005)
Published in Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005 (2005)
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Conference Proceeding
Impact of isotropic plasma etching on channel Si surface roughness measured by AFM and on NMOS inversion layer mobility
Dupre, C., Ernst, T., Borel, S., Morand, Y., Descombes, S., Guillaumot, B., Garros, X., Becu, S., Mescot, X., Ghibaudo, G., Deleonibus, S.
Published in 2008 9th International Conference on Ultimate Integration of Silicon (01.03.2008)
Published in 2008 9th International Conference on Ultimate Integration of Silicon (01.03.2008)
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Conference Proceeding
Investigation into the prospects of five novel oilseed crops within Europe
Marvin, H.J.P, Mastebroek, H.D, Becu, D.M.S, Janssens, R.J.J
Published in Outlook on agriculture (01.03.2000)
Published in Outlook on agriculture (01.03.2000)
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Journal Article
광학계를 결정하기 위한 방법, 및 상기 방법에 의해 결정된 안구 렌즈 및 안구 필터
TATUR GUILLAUME, SCHEYNIKHOVICH DENIS, BECU MARCIA, ARLEO ANGELO, BARANTON KONOGAN, SCHERLEN ANNE CATHERINE, TRANVOUEZ BERNARDIN DELPHINE
Year of Publication 27.03.2020
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Year of Publication 27.03.2020
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