Ultra low energy SIMS, XTEM and X-ray diffraction methods for the characterization of a MBE grown short period (SinGem)16 superlattices
MIRONOV, O. A, FULGONI, D. J. F, MORANTE, J. R, PARRY, C. P, COOKE, G. A, DOWSETT, M. G, PARKER, E. H. C, CHTCHERBATCHEV, K. D, BASSAS, J. M, ROMANO-RODRIGUEZ, A, PEREZ-RODRIGUEZ, A
Published in Thin solid films (15.05.2000)
Published in Thin solid films (15.05.2000)
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Conference Proceeding
Journal Article
Ultra low energy SIMS, XTEM and X-ray diffraction methods for the characterization of a MBE grown short period (Si sub(n)Ge sub(m)) sub(16) superlattices
Mironov, O A, Fulgoni, D J F, Parry, C P, Cooke, G A, Dowsett, M G, Parker, E H C, Chtcherbatchev, K D, Bassas, J M, Romano-Rodriguez, A, Perez-Rodriguez, A, Morante, J R
Published in Thin solid films (01.01.2000)
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Published in Thin solid films (01.01.2000)
Journal Article