Cosmological perturbations of unimodular gravity and general relativity are identical
Basak, Abhishek, Fabre, Ophélia, Shankaranarayanan, S.
Published in General relativity and gravitation (01.10.2016)
Published in General relativity and gravitation (01.10.2016)
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Journal Article
Super-inflation and generation of first order vector perturbations in ELKO
Basak, Abhishek, Shankaranarayanan, S.
Published in Journal of cosmology and astroparticle physics (20.05.2015)
Published in Journal of cosmology and astroparticle physics (20.05.2015)
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Journal Article
Security Assurance for System-on-Chip Designs With Untrusted IPs
Basak, Abhishek, Bhunia, Swarup, Tkacik, Thomas, Ray, Sandip
Published in IEEE transactions on information forensics and security (01.07.2017)
Published in IEEE transactions on information forensics and security (01.07.2017)
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Journal Article
A flexible architecture for systematic implementation of SoC security policies
Basak, Abhishek, Bhunia, Swarup, Ray, Sandip
Published in 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2015)
Published in 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2015)
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Conference Proceeding
IIPS: Infrastructure IP for Secure SoC Design
Xinmu Wang, Yu Zheng, Basak, Abhishek, Bhunia, Swarup
Published in IEEE transactions on computers (01.08.2015)
Published in IEEE transactions on computers (01.08.2015)
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Journal Article
Exploiting design-for-debug for flexible SoC security architecture
Basak, Abhishek, Bhunia, Swarup, Ray, Sandip
Published in 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) (05.06.2016)
Published in 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) (05.06.2016)
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Conference Proceeding
Lorentz invariant dark-spinor and inflation
Basak, Abhishek, Bhatt, Jitesh R
Published in Journal of cosmology and astroparticle physics (01.06.2011)
Published in Journal of cosmology and astroparticle physics (01.06.2011)
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Journal Article
High-Temperature Creep Measurement in Metallic Alloys Using Pulsed Eddy Current Sensors: Influence of Geometry and Magnetic Properties
Venkatesulu, Shyam T, Sharma, Archana, Patankar, Vaibhav H, Kaushik, Ankur, Basak, Abhishek, Sinha, Sunil K
Published in Instrumentation, Mesure, Metrologie (01.04.2024)
Published in Instrumentation, Mesure, Metrologie (01.04.2024)
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Journal Article
Hardware Trojan attacks in embedded memory
Hoque, Tamzidul, Wang, Xinmu, Basak, Abhishek, Karam, Robert, Bhunia, Swarup
Published in 2018 IEEE 36th VLSI Test Symposium (VTS) (01.04.2018)
Published in 2018 IEEE 36th VLSI Test Symposium (VTS) (01.04.2018)
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Conference Proceeding
Attractor behaviour in ELKO cosmology
Basak, Abhishek, Bhatt, Jitesh R, Shankaranarayanan, S, Varma, K V Prasantha
Published in Journal of cosmology and astroparticle physics (01.04.2013)
Published in Journal of cosmology and astroparticle physics (01.04.2013)
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Journal Article
CACI: Dynamic current analysis towards robust recycled chip identification
Yu Zheng, Basak, Abhishek, Bhunia, Swarup
Published in 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2014)
Published in 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2014)
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Conference Proceeding
Correctness and security at odds: Post-silicon validation of modern SoC designs
Ray, Sandip, Jin Yang, Basak, Abhishek, Bhunia, Swarup
Published in 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2015)
Published in 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2015)
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Conference Proceeding
An Open-Source Test-Bench for Autonomous Ultrasound Imaging
Roman, Alex, Dehghanzadeh, Parisa, Pashaei, Vida, Basak, Abhishek, Bhunia, Swarup, Mandal, Soumyajit
Published in 2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS) (01.08.2018)
Published in 2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS) (01.08.2018)
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Conference Proceeding
Active defense against counterfeiting attacks through robust antifuse-based on-chip locks
Basak, Abhishek, Yu Zheng, Bhunia, Swarup
Published in 2014 IEEE 32nd VLSI Test Symposium (VTS) (01.04.2014)
Published in 2014 IEEE 32nd VLSI Test Symposium (VTS) (01.04.2014)
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Conference Proceeding
PiRA: IC authentication utilizing intrinsic variations in pin resistance
Basak, Abhishek, Fengchao Zhang, Bhunia, Swarup
Published in 2015 IEEE International Test Conference (ITC) (01.10.2015)
Published in 2015 IEEE International Test Conference (ITC) (01.10.2015)
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Conference Proceeding
Reconfigurable ECC for adaptive protection of memory
Basak, Abhishek, Paul, Somnath, Jangwon Park, Jongsun Park, Bhunia, Swarup
Published in 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS) (01.08.2013)
Published in 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS) (01.08.2013)
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Conference Proceeding