64 MeV Proton Single-Event Upset Characterization of Customer Memory Interface Design on Xilinx XCKU040 FPGA
Chen, Yanran P., Maillard, Pierre, Hart, Michael, Barton, Jeff, Schmitz, John, Kyu, Patrick
Published in 2017 IEEE Radiation Effects Data Workshop (REDW) (01.07.2017)
Published in 2017 IEEE Radiation Effects Data Workshop (REDW) (01.07.2017)
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Conference Proceeding
Neutron, 64 MeV Proton & Alpha Single-event Characterization of Xilinx 16nm FinFET Zynq® UltraScale+™ MPSoC
Maillard, Pierre, Hart, Michael, Barton, Jeff, Arver, Jue, Smith, Christina
Published in 2017 IEEE Radiation Effects Data Workshop (REDW) (01.07.2017)
Published in 2017 IEEE Radiation Effects Data Workshop (REDW) (01.07.2017)
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Conference Proceeding
64MeV Proton single-event evaluation of Xilinx Single Event Mitigation (XilSEM) firmware on 7nm Versal™ ACAP devices
Chen, Yanran Paula, Maillard, Pierre, Veggalam, Rama Devi, Madem, Saraschandra Reddy, Crabill, Eric, Barton, Jeff, Voogel, Martin
Published in 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) (01.07.2022)
Published in 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) (01.07.2022)
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Conference Proceeding
Single-Event Evaluation of Xilinx 16nm UltraScale+™ Single Event Mitigation IP
Maillard, Pierre, Hart, Michael J., Chang, Paula, Chen, Yanran P., Welter, Michael, Le, Robert, Ismail, Restu, Barton, Jeff, Crabill, Eric
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
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Conference Proceeding
Environmentally Friendly Nickel-Zinc Battery for High Rate Application with Higher Specific Energy
Phillips, Jeff, Mohanta, Sam, Geng, Mingming, Barton, Jeff, McKinney, Bryan, Wu, James
Published in ECS transactions (20.03.2009)
Published in ECS transactions (20.03.2009)
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Journal Article
Single Event Latchup (SEL) and Single Event Upset (SEU) Evaluation of Xilinx 7nm Versal™ ACAP programmable logic (PL)
Maillard, Pierre, Chen, Yanran P., Barton, Jeff, Voogel, Martin L.
Published in 2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) (01.07.2021)
Published in 2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) (01.07.2021)
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Conference Proceeding
Neutron, 64 MeV Proton, Thermal Neutron and Alpha Single-Event Upset Characterization of Xilinx 20nm UltraScale Kintex FPGA
Maillard, Pierre, Hart, Michael, Barton, Jeff, Jain, Praful, Karp, James
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
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Conference Proceeding
PASTED NICKEL HYDROXIDE ELECTRODE FOR RECHARGEABLE NICKEL-ZINC BATTERIES
MOHANTA SAMARESH, PHILLIPS JEFFREY, BARTON JEFF, GENG MINGMING, MUNTASSER ZEIAD M
Year of Publication 25.10.2010
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Year of Publication 25.10.2010
Patent
TIN AND TIN-ZINC PLATED SUBSTRATES TO IMPROVE NI-ZN CELL PERFORMANCE
MOHANTA SAMARESH, PHILLIPS JEFFREY, BARTON JEFF, FENG FENG, MUNTASSER ZEIAD M
Year of Publication 19.07.2010
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Year of Publication 19.07.2010
Patent
Total Ionizing Dose and Single-Events characterization of Xilinx 20nm Kintex UltraScale
Maillard, Pierre, Barton, Jeff, Hart, Michael J., Chen, Yanran P., Voogel, Martin L.
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
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Conference Proceeding
Single-Event Upsets Characterization & Evaluation of Xilinx UltraScale™ Soft Error Mitigation (SEM IP) Tool
Maillard, Pierre, Hart, Michael, Barton, Jeff, Chang, Paula, Welter, Michael, Le, Robert, Ismail, Restu, Crabill, Eric
Published in 2016 IEEE Radiation Effects Data Workshop (REDW) (2016)
Published in 2016 IEEE Radiation Effects Data Workshop (REDW) (2016)
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Conference Proceeding
Impact of Temperature and Vcc Variation on 20nm Kintex UltraScale FPGAs Neutron Soft Error Rate
Maillard, Pierre, Hart, Michael, Barton, Jeff, Jain, Praful, Karp, James
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
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Conference Proceeding
Single-event Evaluation of Xilinx 16nm UltraScale+™ High-Bandwidth Memory Enabled FPGA
Chen, Yanran P., Maillard, Pierre, Barton, Jeff, Crabill, Eric, Kyu, Patrick, Schmitz, John, Hart, Michael J., Voogel, Martin L.
Published in 2019 IEEE Radiation Effects Data Workshop (01.07.2019)
Published in 2019 IEEE Radiation Effects Data Workshop (01.07.2019)
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Conference Proceeding
Biliary obstruction secondary to shrapnel
Mitchell, R, Kerr, R, Barton, J, Schmidt, A
Published in The American journal of gastroenterology (01.10.1991)
Published in The American journal of gastroenterology (01.10.1991)
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Journal Article