An fMRI study examining effects of acute D-cycloserine during symptom provocation in spider phobia
Aupperle, Robin L, Hale, Lisa R, Chambers, Rebecca J, Cain, Sharon E, Barth, Frank X, Sharp, Susan C, Denney, Douglas R, Savage, Cary R
Published in CNS spectrums (01.10.2009)
Published in CNS spectrums (01.10.2009)
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Journal Article
Early Testable Addressable Logic (ETAL) Test Structure: Showcasing the use of an Alternate Logic Yield Learning Test Structure for Technology Development
Ahsan, Ishtiaq, Khan, Shahrukh, Winkler, Joerg, Sekar, Kannan, Bawaskar, Neerja, Crown, Steve, Zhang, Kan, O'tool, Martin, Lin, Teng-Yin, Lagus, Mark, Sohn, D.K., Greenslit, Daniel, Evans, Bill, Laaksonen, Toni, Gordon, Tarl, Song, Zhigang, Liu, Yandong, Masnik, John, Barth, Frank
Published in 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2019)
Published in 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2019)
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Conference Proceeding
Mouthpiece, system and method for enabling a measurement of analytes in exhaled air
Schneider, Stefan, Doehring, Tom, Barth, Frank, Mueller, Klaus, Thuersam, Markus
Year of Publication 20.06.2023
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Year of Publication 20.06.2023
Patent
Mouthpiece, System and Method for Enabling a Measurement of Analytes in Exhaled Air
Schneider, Stefan, Doehring, Tom, Barth, Frank, Mueller, Klaus, Thuersam, Markus
Year of Publication 30.09.2021
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Year of Publication 30.09.2021
Patent
SYSTEM AND METHOD FOR ENABLING A MEASUREMENT OF ANALYTES IN EXHALED AIR
BARTH, Frank, DOEHRING, Tom, MUELLER, Klaus, SCHNEIDER, Stefan, THUERSAM, Markus
Year of Publication 24.03.2021
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Year of Publication 24.03.2021
Patent
MOUTHPIECE, SYSTEM AND METHOD FOR ENABLING A MEASUREMENT OF ANALYTES IN EXHALED AIR
BARTH, Frank, DOEHRING, Tom, MUELLER, Klaus, SCHNEIDER, Stefan, THUERSAM, Markus
Year of Publication 22.04.2020
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Year of Publication 22.04.2020
Patent
Low Cost and Highly Manufacturable MOL/BEOL Constructs in 22FDSOI Technology for High Performance and Low Power Applications
Jain, Navneet, Kim, Juhan, Davar, Sushama, Ahmed, Shibly, Kim, Jeff, Siddiqi, Arif, Herrmann, Thomas, Winkler, Joerg, Barth, Frank, Pika, Jens, Zier, Michael, Schaeffer, Jamie, Rashed, Mahbub, Mittal, Anurag, Blatchford, James, Machha, Sunil, Potta, Siva Krisha, Kashyap, Atul Kumar, Tekuru, Sravan Kumar, Gopannagari, Ram Prasad
Published in 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) (01.03.2018)
Published in 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) (01.03.2018)
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Conference Proceeding
Sistema y procedimiento para liberar una medición de analitos en aire espirado
BARTH, Frank, DOEHRING, Tom, MUELLER, Klaus, SCHNEIDER, Stefan, THUERSAM, Markus
Year of Publication 05.11.2021
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Year of Publication 05.11.2021
Patent