by Kwon, Namyong, Bang, JoonHo, Sung, Won Ju, Han, Jung Hoon, Lee, Dongin, Jung, Ilwoo, Park, Se Guen, Ban, Hyodong, Hwang, Sangjoon, Shin, Won Yong, Bae, Jinhye, Lee, Dongwoo
Published in APL materials (01.02.2024)

by Jang, Dongkyu, Kim, Daekyum, Lee, Jieun, Lee, Inkyum, Ahn, Sang Bin, Hong, Yoonki, Kim, Shindeuk, Park, Taehoon, Ban, Hyodong
Published in Microelectronics and reliability (01.06.2024)

by Cho, Sung-Yong, Choi, Moon-Chul, Baek, Jaehyeok, An, Donggun, Kim, Sang-Hoon, Lee, Daewoong, Yang, Seongyeal, Kim, Se-Mi, Kang, Gil-Young, Park, Juseop, Lee, Kyung-Ho, Jung, Hwan-Chul, Cho, Gun-Hee, Lee, Chan-Yong, Kim, Hye-Ran, Shin, Yong-Jae, Park, Hanna, Lee, Sang-Yong, Kim, Jonghyuk, Won, Bokyeon, Mok, Jungil, Kim, Kijin, Lim, Un-Hak, Jin, Hongjun, Lee, YoungSeok, Kim, Young-Tae, Ha, Heonjoo, Ahn, Jinchan, Sung, Won Ju, Jang, Yoontaek, Song, Hoyoung, Ban, Hyodong, Park, Tae-Hoon, Yoo, Changsik, Oh, Tae-Young, Hwang, SangJoon
Published in IEEE journal of solid-state circuits (16.10.2024)

by Seo, Hyewon, Rim, Taiuk, Lee, Eunsun, Jang, Sekyoung, Chae, Kyosuk, Oh, Jeonghoon, Ban, Hyodong, Lee, Jooyoung
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)

by Lee, Daewoong, Baek, Jaehyeok, Kwon, Hye-Jung, Kwon, Dae-Hyun, Cho, Chulhee, Kim, Sang-Hoon, An, Donggun, Chang, Chulsoon, Lim, Unhak, Im, Jiyeon, Sung, Wonju, Kim, Hye-Ran, Park, Sun-Young, Kim, Hyoung-Joo, Seol, Hoseok, Kim, Juhwan, Shin, Jungbum, Kang, Gil-Young, Kim, Yong-Hun, Kim, Sooyoung, Park, Wansoo, Kim, Seok-Jung, Lee, Chan-Yong, Lee, Seungseob, Park, Tae-Hoon, Oh, Chi-Sung, Ban, Hyodong, Ko, Hyungjong, Song, Hoyoung, Oh, Tae-Young, Hwang, Sang-Joon, Oh, Kyung-Suk, Choi, Jung-Hwan, Lee, Jooyoung
Published in IEEE journal of solid-state circuits (01.01.2023)

by Hwang, Soojung, Kim, Jongkyu, Kim, Juntae, Cha, Dahyun, Kim, Minho, Jang, Dongkyu, Cho, Sunghak, Kim, Seokhyang, Park, Jaeseong, Kim, Hyungjoon, Yu, Sukwon, Song, Boyoung, Ban, Hyodong
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)

by Sung, Won Ju, Kim, Hyun Seung, Han, Jung Hoon, Park, Se Guen, Oh, Jeong-Hoon, Ban, Hyodong, Lee, Jooyoung
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)

by Rim, Taiuk, Che, Kyosuk, Kwon, Sehyun, Lee, Jin-Seong, Oh, Jeonghoon, Ban, Hyodong, Lee, Jooyoung
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)

by Kim, Kanguk, Son, Youngwoo, Ryu, Hoin, Lee, Byunghyun, Kim, Jooncheol, Shin, Hyunsu, Kang, Joonyoung, Kim, Jihun, Jeong, Shinwoo, Chae, Kyosuk, Lee, Dongkak, Jung, Ilwoo, Kim, Yongkwan, Song, Boyoung, Oh, Jeonghoon, Song, Jungwoo, Park, Seguen, Lee, Keumjoo, Ban, Hyodong, Kim, Jiyoung, Lee, Jooyoung
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)

by Lee, Daewoong, Kwon, Hye-Jung, Kwon, Daehyun, Baek, Jaehyeok, Cho, Chulhee, Kim, Sanghoon, An, Donggun, Chang, Chulsoon, Lim, Unhak, Im, Jiyeon, Sung, Wonju, Kim, Hye-Ran, Park, Sun-Young, Kim, HyoungJoo, Seol, Hoseok, Kim, Juhwan, Shin, Junabum, Kang, Kil-Youna, Kim, Yona-Hun, Kim, Sooyoung, Park, Wansoo, Kim, Seok-Jung, Lee, Chanyong, Lee, Seungseob, Park, TaeHoon, Oh, ChiSung, Ban, Hyodong, Ko, Hyungjong, Song, Hoyoung, Oh, Tae-Young, Hwang, SangJoon, Oh, Kyung Suk, Choi, JungHwan, Lee, Jooyoung
Published in 2022 IEEE International Solid- State Circuits Conference (ISSCC) (20.02.2022)

by Cho, Sung-Yong, Choi, Moon-Chul, Baek, Jaehyeok, An, Donggun, Kim, Sanghoon, Lee, Daewoong, Yang, Seongyeal, Kang, Gil-Young, Park, Juseop, Lee, Kyungho, Jung, Hwan-Chul, Cho, Gunhee, Lee, Chanyong, Kim, Hye-Ran, Shin, Yong-Jae, Park, Hanna, Lee, Sangyong, Kim, Jonghyuk, Won, Bokyeon, Mok, Jungil, Kim, Kijin, Lim, Unhak, Jin, Hong-Jun, Lee, YoungSeok, Kim, Young-Tae, Ha, Heonjoo, Ahn, Jinchan, Sung, Wonju, Jang, Yoontaek, Song, Hoyoung, Ban, Hyodong, Park, TaeHoon, Oh, Tae-Young, Yoo, Changsik, Hwang, SangJoon
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)

by HA, Daegwon, KIM, Minwoo, BAN, Hyodong, SONG, Jungwoo, KIM, Jinyong, GU, Bonhong
Year of Publication 13.04.2023

by KIM HYUNCHUL, BAN HYODONG, LEE HYUNJU, PARK WONMO
Year of Publication 19.08.2014

by KIM HYUNCHUL, BAN HYODONG, LEE HYUNJU, PARK WONMO
Year of Publication 16.01.2014

by KIM HYUNCHUL, BAN HYODONG, LEE HYUNJU, PARK WONMO
Year of Publication 10.09.2013

by KIM HYUNCHUL, BAN HYODONG, LEE HYUNJU, PARK WONMO
Year of Publication 16.02.2012

by Donggun Park, Hyodong Ban, Semin Jung, Hungmo Yang, Wonshik Lee
Published in 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) (2000)