Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry
Hilfiker, James N., Singh, Neha, Tiwald, Tom, Convey, Diana, Smith, Steven M., Baker, Jeffrey H., Tompkins, Harland G.
Published in Thin solid films (30.09.2008)
Published in Thin solid films (30.09.2008)
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Conference Proceeding
Characterization and Modeling of Metal/Double-Insulator/Metal Diodes for Millimeter Wave Wireless Receiver Applications
Rockwell, S., Lim, D., Bosco, B.A., Baker, J.H., Eliasson, B., Forsyth, K., Cromar, M.
Published in 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium (01.06.2007)
Published in 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium (01.06.2007)
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Conference Proceeding
Effect of process parameters on the optical constants of thin metal films
Tompkins, Harland G., Baker, Jeffrey H., Convey, Diana
Published in Surface and interface analysis (01.03.2000)
Published in Surface and interface analysis (01.03.2000)
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Conference Proceeding