Electro-thermal simulation of metal interconnections under high current flow
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Journal Article
Conference Proceeding
Characterization of YSZ films by means of C- V measurements and TEM observations
Bagnoli, P.E., Ciofi, C., Diligenti, A., Innamorato, A., Nannini, A.
Published in Thin solid films (01.08.1995)
Published in Thin solid films (01.08.1995)
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Journal Article
Development of an erbium-doped fibre laser as a deep-sea hydrophone
Bagnoli, P E, Beverini, N, Falciai, R, Maccioni, E, Morganti, M, Sorrentino, F, Stefani, F, Trono, C
Published in Journal of optics. A, Pure and applied optics (01.07.2006)
Published in Journal of optics. A, Pure and applied optics (01.07.2006)
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Journal Article
Conference Proceeding
Electromigration and low-frequency resistance fluctuations in aluminum thin-film interconnections
Neri, B., Diligenti, A., Bagnoli, P.E.
Published in IEEE transactions on electron devices (01.11.1987)
Published in IEEE transactions on electron devices (01.11.1987)
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Journal Article
Electromigration in Al based stripes: Low frequency noise measurements and MTF tests
Bagnoli, P.E., Ciofi, C., Neri, B., Pennelli, G.
Published in Microelectronics and reliability (1996)
Published in Microelectronics and reliability (1996)
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Journal Article
Electromigration detection by means of low-frequency noise measurements in thin-film interconnections
Diligenti, A., Neri, B., Bagnoli, P.E., Barsanti, A., Rizzo, M.
Published in IEEE electron device letters (01.11.1985)
Published in IEEE electron device letters (01.11.1985)
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Journal Article
Electrical characteristics of silicon nitride on silicon and InGaAs as a function of the insulator stoichiometry
Bagnoli, P.E., Piccirillo, A., Gobbi, A.L., Giannetti, R.
Published in Applied surface science (01.10.1991)
Published in Applied surface science (01.10.1991)
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Journal Article
Silicon nitride/semiconductor interface state density as a function of the insulator stoichiometry
Bagnoli, P.E., Piccirillo, A., Valenti, P., Civale, G., Gobbi, A.L.
Published in Applied surface science (1992)
Published in Applied surface science (1992)
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Conference Proceeding
Photoluminescence investigation of III-V semiconductor surface damage induced by PECVD silicon nitride films
Piccirillo, A., Marzano, R., Gobbi, A.L., Bagnoli, P.E.
Published in Applied surface science (01.12.1991)
Published in Applied surface science (01.12.1991)
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Journal Article
Transient behavior of flat-band voltage during hydrogen and deuterium adsorption on Pd-gate MOS structures
Nannini, A., Bagnoli, P.E., Diligenti, A., Ciuti, V.
Published in Solid-state electronics (01.01.1985)
Published in Solid-state electronics (01.01.1985)
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Journal Article
Thermo-mechanical analysis of 3-D multilayer structures for power electronic devices
Bagnoli, P E, Girardi, M, Padovani, C, Pagni, A, Pasquinelli, G
Published in 2010 3rd International Conference on Thermal Issues in Emerging Technologies Theory and Applications (01.12.2010)
Published in 2010 3rd International Conference on Thermal Issues in Emerging Technologies Theory and Applications (01.12.2010)
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Conference Proceeding
Erbium-doped fiber lasers as deep-sea hydrophones
Bagnoli, P.E., Beverini, N., Bouhadef, B., Castorina, E., Falchini, E., Falciai, R., Flaminio, V., Maccioni, E., Morganti, M., Sorrentino, F., Stefani, F., Trono, C.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (15.11.2006)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (15.11.2006)
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