High rejection bandpass optical filters based on sub-wavelength metal patch arrays
Le Perchec, J, de Lamaestre, R Espiau, Brun, M, Rochat, N, Gravrand, O, Badano, G, Hazart, J, Nicoletti, S
Published in Optics express (15.08.2011)
Published in Optics express (15.08.2011)
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Journal Article
MBE Growth of Strained HgTe/CdTe Topological Insulator Structures
Ballet, P., Thomas, C., Baudry, X., Bouvier, C., Crauste, O., Meunier, T., Badano, G., Veillerot, M., Barnes, J. P., Jouneau, P. H., Levy, L. P.
Published in Journal of electronic materials (01.08.2014)
Published in Journal of electronic materials (01.08.2014)
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Journal Article
Conference Proceeding
Reduction of the dislocation density in molecular beam epitaxial CdTe(2 1 1)B on Ge(2 1 1)
Badano, G., Robin, I.C., Amstatt, B., Gemain, F., Baudry, X.
Published in Journal of crystal growth (01.05.2010)
Published in Journal of crystal growth (01.05.2010)
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Journal Article
Defect characterization for epitaxial HgCdTe alloys by electron microscopy
Aoki, T., Chang, Y., Badano, G., Zhao, J., Grein, C., Sivananthan, S., Smith, David J.
Published in Journal of crystal growth (15.04.2004)
Published in Journal of crystal growth (15.04.2004)
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Journal Article
Molecular beam epitaxy growth of HgCdTe on Ge for third-generation infrared detectors
ZANATTA, J. P, BADANO, G, DESTEFANIS, G, MIBORD, S, BROCHIER, E, COSTA, P, BALLET, P, LARGERON, C, BAYLET, J, GRAVRAND, O, ROTHMAN, J, CASTELEIN, P, CHAMONAL, J. P, MILLION, A
Published in Journal of electronic materials (01.06.2006)
Published in Journal of electronic materials (01.06.2006)
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Journal Article
Fast detection of precipitates and oxides on CdZnTe surfaces by spectroscopic ellipsometry
BADANO, G, MILLION, A, CANAVA, B, TRAN-VAN, P, ETCHEBERRY, A
Published in Journal of electronic materials (01.08.2007)
Published in Journal of electronic materials (01.08.2007)
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Conference Proceeding
Journal Article
In situ real-time analysis of the MBE growth of CdTe on Ge: A comparison of ellipsometry data analysis techniques
Badano, G., Ballet, P., Baudry, X., Zanatta, J.P., Million, A.
Published in Journal of crystal growth (01.11.2006)
Published in Journal of crystal growth (01.11.2006)
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Journal Article
Composition and thickness distribution of HgCdTe molecular beam epitaxy wafers by infrared microscope mapping
Chang, Yong, Badano, G., Jiang, E., Garland, J.W., Zhao, J., Grein, C.H., Sivananthan, S.
Published in Journal of crystal growth (15.04.2005)
Published in Journal of crystal growth (15.04.2005)
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Journal Article
Electron microscopy of surface-crater defects on HgCdTe/CdZnTe(211)B epilayers grown by molecular-beam epitaxy
AOKI, T, CHANG, Y, BADANO, G, ZHAO, J, GREIN, C, SIVANANTHAN, S, SMITH, David J
Published in Journal of electronic materials (01.07.2003)
Published in Journal of electronic materials (01.07.2003)
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Conference Proceeding
Journal Article
Correlation of CdZnTe(211)B substrate surface morphology and HgCdTe(211)B epilayer defects
ZHAO, J, CHANG, Y, DHAR, N, BADANO, G, SIVANANTHAN, S, MARKUNAS, J, LEWIS, S, DINAN, J. H, WIJEWARNASURIYA, P. S, CHEN, Y, BRILL, G
Published in Journal of electronic materials (01.08.2004)
Published in Journal of electronic materials (01.08.2004)
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Journal Article
Near-bandgap infrared absorption properties of HgCdTe
CHANG, Y, BADANO, G, ZHAO, J, ZHOU, Y. D, ASHOKAN, R, GREIN, C. H, NATHAN, V
Published in Journal of electronic materials (01.06.2004)
Published in Journal of electronic materials (01.06.2004)
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Conference Proceeding
Journal Article
In-situ ellipsometry studies of adsorption of Hg on CdTe(211)B/Si(211) and molecular beam epitaxy growth of hgcdte(211)B
BADANO, G, CHANG, Y, GARLAND, J. W, SIVANANTHAN, S
Published in Journal of electronic materials (01.06.2004)
Published in Journal of electronic materials (01.06.2004)
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Conference Proceeding
Journal Article
Ellipsometric study of the nucleation of (2 1 1) HgCdTe on CdZnTe(2 1 1)B
Badano, G., Zhao, J., Chang, Y., Garland, J.W., Sivananthan, S.
Published in Journal of crystal growth (01.11.2003)
Published in Journal of crystal growth (01.11.2003)
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Journal Article
HgCdTe/CdTe/Si infrared photodetectors grown by MBE for near-room temperature operation
VELICU, S, BADANO, G, SELAMET, Y, GREIN, C. H, FAURIE, J. P, SIVANANTHAN, S, BOIERIU, P, RAFOL, D. O. N, ASHOKAN, R
Published in Journal of electronic materials (01.06.2001)
Published in Journal of electronic materials (01.06.2001)
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Conference Proceeding
Journal Article
Partially localized hybrid surface plasmon mode for thin-film semiconductor infrared photodetection
Fowler, Daivid, Boutami, Salim, Duperron, Matthieu, Moille, Gregory, Badano, Giacomo, Boulard, François, Rothman, Johan, Gravrand, Olivier, Espiau de Lamaestre, Roch
Published in Optics letters (01.02.2013)
Published in Optics letters (01.02.2013)
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Journal Article
Accuracy of the in situ determination of the CdZnTe temperature by ellipsometry before the growth of HgCdTe by MBE
Badano, Giacomo, Garland, James W., Sivananthan, S.
Published in Journal of crystal growth (01.04.2003)
Published in Journal of crystal growth (01.04.2003)
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Journal Article
Conference Proceeding
HgCdTe/Te Intergrowths and Precipitates in HgCdTe alloys grown by Molecular Beam Epitaxy
Aoki, T., Smith, David J., Chang, Y., Zhao, J., Zhou, Y., Badano, G., Grein, C., Sivananthan, S.
Published in Microscopy and microanalysis (01.08.2003)
Published in Microscopy and microanalysis (01.08.2003)
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Journal Article
In-situ ellipsometric characterization of nucleation conditions of HgCdTe grown by MBE
Badano, G., Zhao, J., Sivananthan, S., Aoki, T., Smith, D.
Published in International Conference on Molecular Bean Epitaxy (2002)
Published in International Conference on Molecular Bean Epitaxy (2002)
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Conference Proceeding