by Vaz, Pablo Ilha, Girard, Patrick, Virazel, Arnaud, Aziza, Hassen
Published in IEEE transactions on very large scale integration (VLSI) systems (01.06.2021)

by Bazzi, Hussein, Harb, Adnan, Aziza, Hassen, Moreau, Mathieu, Kassem, Abdallah
Published in Analog integrated circuits and signal processing (01.02.2021)

by Aziza, Hassen, Postel-Pellerin, Jeremy, Bazzi, Hussein, Canet, Pierre, Moreau, Mathieu, Della Marca, Vincenzo, Harb, Adnan
Published in IEEE transactions on nanotechnology (01.01.2020)

by Hajri, Basma, Aziza, Hassen, Mansour, Mohammad M., Chehab, Ali
Published in IEEE access (2019)

by Xun, Hanzhi, Yuan, Sicong, Fieback, Moritz, Aziza, Hassen, Taouil, Mottaqiallah, Hamdioui, Said
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)

by Bazzi, Hussein, Aziza, Hassen, Moreau, Mathieu, Harb, Adnan
Published in Journal of electronic testing (01.08.2021)

by Hajri, Basma, Mansour, Mohammad M., Chehab, Ali, Aziza, Hassen
Published in IEEE transactions on nanotechnology (2019)

by Xun, Hanzhi, Fieback, Moritz, Yuan, Sicong, Aziza, Hassen, Heidekamp, Mathijs, Copetti, Thiago, Poehls, Leticia Bolzani, Taouil, Mottaqiallah, Hamdioui, Said
Published in 2023 IEEE 32nd Asian Test Symposium (ATS) (14.10.2023)

by Micolau, Gilles, Coulié, Karine, Rahajandraibe, Wenceslas, Portal, Jean-Michel, Aziza, Hassen
Published in E3S Web of Conferences (01.01.2019)

by Bocquet, Marc, Aziza, Hassen, Zhao, Weisheng, Zhang, Yue, Onkaraiah, Santhosh, Muller, Christophe, Reyboz, Marina, Deleruyelle, Damien, Clermidy, Fabien, Portal, Jean-Michel
Published in Journal of low power electronics and applications (01.01.2014)

by Zitouni, Wafa, Vauche, Remy, Aziza, Hassen, Ayache, Laila, Makdissi, Alaa
Published in 2023 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS) (01.11.2023)

by Aziza, Hassen, Zambelli, Cristian, Hamdioui, Said, Diware, Sumit, Bishnoi, Rajendra, Gebregiorgis, Anteneh
Published in 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC) (16.10.2023)

by Xun, Hanzhi, Fieback, Moritz, Yaldagard, Mohammad Amin, Yuan, Sicong, Aziza, Hassen, Taouil, Mottaqiallah, Hamdioui, Said
Published in 2024 IEEE European Test Symposium (ETS) (20.05.2024)

by Bocquet, Marc, Deleruyelle, Damien, Aziza, Hassen, Muller, Christophe, Portal, Jean-Michel, Cabout, Thomas, Jalaguier, Eric
Published in IEEE transactions on electron devices (01.03.2014)

by Devoge, Paul, Aziza, Hassen, Lorenzini, Philippe, Masson, Pascal, Malherbe, Alexandre, Julien, Franck, Marzaki, Abderrezak, Regnier, Arnaud, Niel, Stephan
Published in Solid-state electronics (01.03.2023)

by Gay, R., Marca, V. Della, Aziza, H., Laine, P., Regnier, A., Niel, S., Marzaki, A.
Published in Microelectronics and reliability (01.11.2021)

by Xun, Hanzhi, Fieback, Moritz, Yuan, Sicong, Aziza, Hassen, Taouil, Mottaqiallah, Hamdioui, Said
Published in 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) (25.03.2024)

by Devoge, P., Aziza, H., Lorenzini, P., Julien, F., Marzaki, A., Malherbe, A., Mantelli, M., Cabout, T., Delalleau, J., Haendler, S., Regnier, A., Niel, S.
Published in Microelectronics and reliability (01.11.2021)

by Aziza, H., Hajri, B., Mansour, M., Chehab, A., Perez, A.
Published in Microelectronics and reliability (01.09.2018)

by Fieback, Moritz, Wu, Lizhou, Medeiros, Guilherme Cardoso, Aziza, Hassen, Rao, Siddharth, Marinissen, Erik Jan, Taouil, Mottaqiallah, Hamdioui, Said
Published in 2019 IEEE International Test Conference (ITC) (01.11.2019)