Latent interface-trap buildup and its implications for hardness assurance (MOS transistors)
Schwank, J.R., Fleetwood, D.M., Shaneyfelt, M.R., Winokur, P.S., Axness, C.L., Riewe, L.C.
Published in IEEE transactions on nuclear science (01.12.1992)
Published in IEEE transactions on nuclear science (01.12.1992)
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Conference Proceeding
Modeling the time-dependent transient radiation response of semiconductor junctions
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Conference Proceeding
SEU simulation and testing of resistor-hardened D-latches in the SA3300 microprocessor
Sexton, F.W., Corbett, W.T., Treece, R.K., Hass, K.J., Hughes, K.L., Axness, C.L., Hash, G.L., Shaneyfelt, M.R., Wunsch, T.F.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1991)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1991)
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Conference Proceeding
Radiation characteristics of SIPOS and polysilicon resistors
Axness, C.L., Riewe, L., Reber, R.A., Liang, A.Y., Ang, S.S., Brown, W.D.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1991)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1991)
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Journal Article
Conference Proceeding
SEU characterization and design dependence of the SA3300 microprocessor
Sexton, F.W., Treece, R.K., Hass, K.J., Hughes, K.L., Hash, G.L., Axness, C.L., Buchner, S.P., Kang, K.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1990)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1990)
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Conference Proceeding
Single event upset in irradiated 16 K CMOS SRAMs
Axness, C.L., Schwank, J.R., Winokur, P.S., Browning, J.S., Koga, R., Fleetwood, D.M.
Published in IEEE transactions on nuclear science (01.12.1988)
Published in IEEE transactions on nuclear science (01.12.1988)
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Journal Article
A proposed new structure for SEU immunity in SRAM employing drain resistance
Ochoa, A., Axness, C.L., Weaver, H.T., Fu, J.S.
Published in IEEE electron device letters (01.11.1987)
Published in IEEE electron device letters (01.11.1987)
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Journal Article
RAM cell recovery mechanisms following high-energy ion strikes
Weaver, H.T., Axness, C.L., Fu, J.S., Binkley, J.S., Mansfield, J.
Published in IEEE electron device letters (01.01.1987)
Published in IEEE electron device letters (01.01.1987)
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Journal Article
Single Event Upset In CMOS Static Ram And Latches
Axness, C.L., Weaver, H.T., Giddings, A.E., Shafer, B.D.
Published in [1987] NASECODE V: Proceedings of the Fifth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits (1987)
Published in [1987] NASECODE V: Proceedings of the Fifth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits (1987)
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