Thermomechanical failures in silicon electronic devices
Atluri, V.P., Dass, L.M., Seshan, K., Patel, K.C., Stage, R.W., Alexander TP, Dory, T.S., Balakrishnan, S.
Published in Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130) (2000)
Published in Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130) (2000)
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