by ATANASSOVA, E, PASKALEVA, A
Published in Microelectronics and reliability (01.06.2007)

by NOVKOVSKI, N, ATANASSOVA, E
Published in Thin solid films (31.01.2011)

by Atanassova, E
Published in Microelectronics and reliability (01.08.1999)

by NOVKOVSKI, N, ATANASSOVA, E
Published in Applied physics. A, Materials science & processing (01.06.2006)

by Paskaleva, A, Atanassova, E, Novkovski, N
Published in Journal of physics. D, Applied physics (21.01.2009)

by Karmakov, Y., Paskaleva, A., Atanassova, E.
Published in Applied surface science (01.03.2012)

by Atanassova, E, Lytvyn, P, Dub, S N, Konakova, R V, Mitin, V F, Spassov, D
Published in Journal of physics. D, Applied physics (28.11.2012)

by ATANASSOVA, E, GEORGIEVA, M, SPASSOV, D, PASKALEVA, A
Published in Microelectronic engineering (01.04.2010)

by Atanassova, E., Paskaleva, A., Spassov, D.
Published in Microelectronics and reliability (01.04.2012)

by Atanassova, E, Spassov, D
Published in Applied surface science (01.09.1998)

by SPASSOV, D, ATANASSOVA, E, PASKALEVA, A
Published in Microelectronics and reliability (01.12.2011)

by Atanassova, E., Novkovski, N., Spassov, D., Paskaleva, A., Skeparovski, A.
Published in Microelectronics and reliability (01.02.2014)

by Karmakov, I., Konova, A., Atanassova, E., Paskaleva, A.
Published in Applied surface science (30.08.2009)

by ATANASSOVA, E, SPASSOV, D, PASKALEVA, A, GEORGIEVA, M, KOPRINAROVA, J
Published in Thin solid films (01.10.2008)

by PASKALEVA, A, ATANASSOVA, E
Published in Materials science in semiconductor processing (15.12.2010)

by Stojanovska-Georgievska, L., Novkovski, N., Atanassova, E.
Published in Physica. B, Condensed matter (01.09.2011)

by SPASSOV, D, ATANASSOVA, E, VIROVSKA, D
Published in Applied physics. A, Materials science & processing (2006)

by Atanassova, E, Stojadinovi, N, Spassov, D, Mani, I, Paskaleva, A
Published in Semiconductor science and technology (01.05.2013)

by Atanassova, E., Spassov, D., Paskaleva, A., Kostov, K.
Published in Applied surface science (30.12.2006)

by ATANASSOVA, E, PASKALEVA, A, NOVKOVSKI, N
Published in Microelectronics and reliability (01.04.2008)