Effects of Threshold Voltage Variations on Single-Event Upset Response of Sequential Circuits at Advanced Technology Nodes
Hangfang Zhang, Hui Jiang, Assis, Thiago R., Mahatme, Nihaar N., Narasimham, Balaji, Massengill, Lloyd W., Bhuva, Bharat L., Shi-Jie Wen, Wong, Richard
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
Get full text
Journal Article
Angular Effects of Heavy-Ion Strikes on Single-Event Upset Response of Flip-Flop Designs in 16-nm Bulk FinFET Technology
Hangfang Zhang, Hui Jiang, Assis, Thiago R., Ball, Dennis R., Narasimham, Balaji, Anvar, Ali, Massengill, Lloyd W., Bhuva, Bharat L.
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
Get full text
Journal Article
Outstanding Conference Paper Award: 2015 IEEE Nuclear and Space Radiation Effects Conference
Dodds, Nathaniel Anson, Martinez, Marino, Dodd, Paul E., Shaneyfelt, Marty R., Sexton, Frederick W., Black, Jeffrey D., Lee, David S., Swanson, Scot E., Bhuva, Bharat L., Warren, Kevin M., Reed, Robert A., Trippe, James, Sierawski, Brian D., Weller, Robert A., Mahatme, Nihaar, Gaspard, Nelson J., Assis, Thiago R., Austin, Rebekah, Weeden-Wright, Stephanie L., Massengill, Lloyd W., Swift, Gary, Wirthlin, Michael, Cannon, Matthew, Liu, Rui, Chen, Li, Kelly, Andrew T., Marshall, Paul W., Trinczek, Michael, Blackmore, Ewart W., Wen, Shi -Jie, Wong, Richard, Narasimham, Balaji, Pellish, Jonathan A., Puchner, Helmut
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
Get full text
Journal Article
High-speed pulsed-hysteresis-latch design for improved SER performance in 20 nm bulk CMOS process
Narasimham, Balaji, Chandrasekharan, Karthik, Wang, Jung K., Djaja, Gregory, Gaspard, Nelson J., Mahatme, Nihaar N., Assis, Thiago R., Bhuva, Bharat L.
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Get full text
Conference Proceeding
Single-event upset responses of dual- and triple-well designs at advanced planar and FinFET technologies
Hangfang Zhang, Hui Jiang, Assis, Thiago R., Ball, Dennis R., Chatterjee, Indranil, Narasimham, Balaji, Nsengiyumva, Patrick, Massengill, Lloyd W., Bhuva, Bharat L.
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2016)
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2016)
Get full text
Conference Proceeding
Impact of particle LET on combinational logic single-event effects for advanced technologies
Hui Jiang, Hangfang Zhang, Mahatme, Nihaar N., Chatterjee, Indranil, Assis, Thiago R., Kauppila, Jeff S., Bhuva, Bharat L., Massengill, Lloyd W.
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2016)
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2016)
Get full text
Conference Proceeding