Spectroscopic ellipsometry — Past, present, and future
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Combined direct- and reciprocal-space approach for converting spectra to energy scales with negligible loss of information
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Analytic representation of the dielectric functions of InAs x Sb1- x alloys in the parametric model
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Published in Thin solid films (01.11.2013)
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Parametric modeling of the dielectric functions of Cd1−xMgxTe alloy films
Ihn, Y.S., Kim, T.J., Ghong, T.H., Kim, Y.D., Aspnes, D.E., Kossut, J.
Published in Thin solid films (01.05.2004)
Published in Thin solid films (01.05.2004)
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Differences Between Charge Trapping States in Irradiated Nano-Crystalline HfO sub(2) and Non-Crystalline Hf Silicates
Lucovsky, G, Fleetwood, D M, Lee, S, Seo, H, Schrimpf, R D, Felix, JA, Lning, J, Fleming, L B, Ulrich, M, Aspnes, DE
Published in IEEE transactions on nuclear science (01.01.2006)
Published in IEEE transactions on nuclear science (01.01.2006)
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Real-time optical diagnostics for epitaxial growth
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