by Asoro, M. A, Kovar, D, Ferreira, P. J
Published in Chemical communications (Cambridge, England) (01.01.2014)

by ASORO, M. A, FERREIRA, P. J, KOVAR, D
Published in Acta materialia (01.12.2014)

by Asoro, M A, Kovar, D, Shao-Horn, Y, Allard, L F, Ferreira, P J
Published in Nanotechnology (15.01.2010)

by Asoro, M, Damiano, J, Ferreira, PJ
Published in Microscopy and microanalysis (01.07.2009)

by Auth, C., Aliyarukunju, A., Asoro, M., Bergstrom, D., Bhagwat, V., Birdsall, J., Bisnik, N., Buehler, M., Chikarmane, V., Ding, G., Fu, Q., Gomez, H., Han, W., Hanken, D., Haran, M., Hattendorf, M., Heussner, R., Hiramatsu, H., Ho, B., Jaloviar, S., Jin, I., Joshi, S., Kirby, S., Kosaraju, S., Kothari, H., Leatherman, G., Lee, K., Leib, J., Madhavan, A., Marla, K., Meyer, H., Mule, T., Parker, C., Parthasarathy, S., Pelto, C., Pipes, L., Post, I., Prince, M., Rahman, A., Rajamani, S., Saha, A., Santos, J. Dacuna, Sharma, M., Sharma, V., Shin, J., Sinha, P., Smith, P., Sprinkle, M., St. Amour, A., Staus, C., Suri, R., Towner, D., Tripathi, A., Tura, A., Ward, C., Yeoh, A.
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)

by Asoro, M, Shao-Horn, Y, Kovar, D, Allard, LF, Ferreira, PJ
Published in Microscopy and microanalysis (01.07.2009)

by Asoro, M, Kovar, D, Ferreira, P
Published in Microscopy and microanalysis (01.07.2011)

by Hafez, W., Agnihotri, P., Asoro, M., Aykol, M., Bains, B., Bambery, R., Bapna, M., Barik, A., Chatterjee, A., Chiu, P.C., Chu, T., Firby, C., Fischer, K., Fradkin, M., Greve, H., Gupta, A., Haralson, E., Haran, M., Hicks, J., Illa, A., Jang, M., Klopcic, S., Kobrinsky, M., Kuns, B., Lai, H.-h., Lanni, G., Lee, S.-H., Lindert, N., Lo, C.-l., Luo, Y., Malyavanatham, G., Marinkovic, B., Maymon, Y., Nabors, M., Neirynck, J., Packan, P., Paliwal, A., Pantisano, L., Paulson, L., Penmatsa, P., Prasad, C., Puls, C., Rahman, T., Ramaswamy, R., Samant, S., Sell, B., Sethi, K., Shah, F., Shamanna, M., Shang, K., Li, Q., Sibakoti, M., Stoeger, J., Strutt, N., Thirugnanasambandam, R., Tsai, C., Wang, X., Wang, A., Wu, S.-j., Xu, Q., Zhong, X.-h., Natarajan, S.
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)

by Asoro, MA, Kovar, D, Ferreira, P J
Published in Chemical communications (Cambridge, England) (01.04.2014)

by Yeoh, A., Madhavan, A., Kybert, N., Anand, S., Shin, J., Asoro, M., Samarajeewa, S., Steigerwald, J., Ganpule, C., Buehler, M., Tripathi, A., Souw, V., Haran, M., Nigam, S., Chikarmane, V., Yashar, P., Mule, T., Wu, Y-H., Lee, K-S., Aykol, M., Marla, K., Sinha, P., Kirby, S., Hiramatsu, H., Han, W., Mori, M., Sharma, M., Jeedigunta, H., Sprinkle, M., Pelto, C., Tanniru, M., Leatherman, G., Fischer, K., Post, I., Auth, C.
Published in 2018 IEEE International Interconnect Technology Conference (IITC) (01.06.2018)

by Asoro, MA, Kovar, D, Damiano, J, Ferreira, PJ
Published in Microscopy and microanalysis (01.07.2010)