110 GHz on-wafer measurement comparison on alumina substrate
Probst, Thorsten, Doerner, Ralf, Ohlrogge, Matthias, Lozar, Roger, Arz, Uwe
Published in 2017 90th ARFTG Microwave Measurement Symposium (ARFTG) (01.11.2017)
Published in 2017 90th ARFTG Microwave Measurement Symposium (ARFTG) (01.11.2017)
Get full text
Conference Proceeding
Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz
Arz, Uwe, Kuhlmann, Karsten, Dziomba, Thorsten, Hechtfischer, Gerd, Phung, Gia Ngoc, Schmuckle, Franz Josef, Heinrich, Wolfgang
Published in IEEE transactions on microwave theory and techniques (01.06.2019)
Published in IEEE transactions on microwave theory and techniques (01.06.2019)
Get full text
Journal Article
Interlaboratory Comparison of Dielectric Measurements From Microwave to Terahertz Frequencies Using VNA-Based and Optical-Based Methods
Shang, Xiaobang, Naftaly, Mira, Skinner, James, Ausden, Liam, Gregory, Andrew, Ridler, Nick M., Arz, Uwe, Phung, Gia Ngoc, Ulm, David, Kleine-Ostmann, Thomas, Allal, Djamel, Wojciechowski, Marcin, Kazemipour, Alireza, Gaumann, Gregory, Hudlicka, Martin
Published in IEEE transactions on microwave theory and techniques (2024)
Published in IEEE transactions on microwave theory and techniques (2024)
Get full text
Journal Article
A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies
Lozar, Roger, Ohlrogge, Matthias, Weber, Rainer, Ridler, Nick M., Shang, Xiaobang, Probst, Thorsten, Arz, Uwe
Published in IEEE transactions on microwave theory and techniques (01.08.2019)
Published in IEEE transactions on microwave theory and techniques (01.08.2019)
Get full text
Journal Article
Measurement and Analysis of On-Wafer Test Structures for Signal Integrity Assessment at Chip Level
Pham, Thi Dao, Ngoc Phung, Gia, Lahbacha, Khitem, Maffucci, Antonio, Miele, Gianfranco, Arz, Uwe, Allal, Djamel
Published in 2024 Conference on Precision Electromagnetic Measurements (CPEM) (08.07.2024)
Published in 2024 Conference on Precision Electromagnetic Measurements (CPEM) (08.07.2024)
Get full text
Conference Proceeding
Comparison between time- and frequency-domain high-frequency device characterizations
Bieler, Mark, Arz, Uwe
Published in 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) (01.07.2016)
Published in 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) (01.07.2016)
Get full text
Conference Proceeding
High-Frequency Modeling of Coplanar Waveguides Including Surface Roughness
Gold, Gerald, Lomakin, Konstantin, Helmreich, Klaus, Arz, Uwe
Published in Advances in radio science (19.09.2019)
Published in Advances in radio science (19.09.2019)
Get full text
Journal Article
Improving the Performance of 110 GHz Membrane-Based Interconnects on Silicon: Modeling, Measurements, and Uncertainty Analysis
Arz, Uwe, Rohland, Martina, Buttgenbach, Stephanus
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.11.2013)
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.11.2013)
Get full text
Journal Article
An optimal vector-network-analyzer calibration algorithm
Williams, D.F., Wang, J.C.M., Arz, U.
Published in IEEE transactions on microwave theory and techniques (01.12.2003)
Published in IEEE transactions on microwave theory and techniques (01.12.2003)
Get full text
Journal Article
Improved permittivity measurement of dielectric substrates by use of the TE111 mode of a split-cylinder cavity
Janezic, M.D., Arz, U., Begley, S., Bartley, P.
Published in 2009 73rd ARFTG Microwave Measurement Conference (01.06.2009)
Published in 2009 73rd ARFTG Microwave Measurement Conference (01.06.2009)
Get full text
Conference Proceeding
On the Influence of Thru- and Line-Length-Related Effects in CPW- Based Multiline TRL Calibrations
Phung, Gia Ngoc, Arz, Uwe
Published in 2021 97th ARFTG Microwave Measurement Conference (ARFTG) (25.06.2021)
Published in 2021 97th ARFTG Microwave Measurement Conference (ARFTG) (25.06.2021)
Get full text
Conference Proceeding
Impact of Chuck Boundary Conditions on Wideband On-Wafer Measurements
Phung, Gia Ngoc, Arz, Uwe
Published in 2021 IEEE 25th Workshop on Signal and Power Integrity (SPI) (10.05.2021)
Published in 2021 IEEE 25th Workshop on Signal and Power Integrity (SPI) (10.05.2021)
Get full text
Conference Proceeding
Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides
Get full text
Conference Proceeding
Traceable Lumped-Element Calibrations up to 110 GHz on Commercial Calibration Substrates
Arz, Uwe, Phung, Gia Ngoc, Rumiantsev, Andrej
Published in 2023 100th ARFTG Microwave Measurement Conference (ARFTG) (22.01.2023)
Published in 2023 100th ARFTG Microwave Measurement Conference (ARFTG) (22.01.2023)
Get full text
Conference Proceeding
Anomalies in multiline-TRL-corrected measurements of short CPW lines
Phung, Gia Ngoc, Arz, Uwe
Published in 2021 96th ARFTG Microwave Measurement Conference (ARFTG) (18.01.2021)
Published in 2021 96th ARFTG Microwave Measurement Conference (ARFTG) (18.01.2021)
Get full text
Conference Proceeding