Physical Mechanisms of Proton-Induced Single-Event Upset in Integrated Memory Devices
Caron, P., Inguimbert, C., Artola, L., Ecoffet, R., Bezerra, F.
Published in IEEE transactions on nuclear science (01.07.2019)
Published in IEEE transactions on nuclear science (01.07.2019)
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Journal Article
Compact Modeling of Single-Event Latchup of Integrated CMOS Circuit
Al Youssef, A., Artola, L., Ducret, S., Hubert, G.
Published in IEEE transactions on nuclear science (01.07.2019)
Published in IEEE transactions on nuclear science (01.07.2019)
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Journal Article
SEFI Modeling in Readout Integrated Circuit Induced by Heavy Ions at Cryogenic Temperatures
Artola, L., Ducret, S., Advent, F., Hubert, G., Mekki, J.
Published in IEEE transactions on nuclear science (01.01.2019)
Published in IEEE transactions on nuclear science (01.01.2019)
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Journal Article
Investigation of the Impact of Angles and Rotation of Low-Energy Protons in SRAM Cells Down to 16 nm
Artola, L., Glorieux, M., Hubert, G., Inguimbert, C., Bonnoit, T., Rey, R., Lange, T., Levacq, D., Poivey, C.
Published in IEEE transactions on nuclear science (01.04.2024)
Published in IEEE transactions on nuclear science (01.04.2024)
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Journal Article
Role of Electron-Induced Coulomb Interactions to the Total SEU Rate During Earth and JUICE Missions
Caron, P., Inguimbert, C., Artola, L., Bezerra, F., Ecoffet, R.
Published in IEEE transactions on nuclear science (01.08.2021)
Published in IEEE transactions on nuclear science (01.08.2021)
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Journal Article
Investigation of Electrical Latchup and SEL Mechanisms at Low Temperature for Applications Down to 50 K
Al Youssef, A., Artola, L., Ducret, S., Hubert, G., Perrier, F.
Published in IEEE transactions on nuclear science (01.08.2017)
Published in IEEE transactions on nuclear science (01.08.2017)
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Journal Article
Comparative soft error evaluation of layout cells in FinFET technology
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Journal Article
Conference Proceeding
Impact of 1 MeV proton irradiation on InGaAsN solar cells
Levillayer, M, Duzellier, S, Massiot, I, Arnoult, A, Parola, S, Rey, R, Almuneau, G, Artola, L
Published in Semiconductor science and technology (01.05.2022)
Published in Semiconductor science and technology (01.05.2022)
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Journal Article
Degradation Study of InGaAsN p-i-n Solar Cell Under 1-MeV Electron Irradiation
Levillayer, M., Duzellier, S., Massiot, I., Arnoult, A., Nuns, T., Inguimbert, C., Aicardi, C., Parola, S., Olivie, F., Monflier, R., Le Cocq, T., Rey, R., Pons, C., Almuneau, G., Artola, L.
Published in IEEE transactions on nuclear science (01.08.2021)
Published in IEEE transactions on nuclear science (01.08.2021)
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Journal Article
New SEU Modeling Method for Calibrating Target System to Multiple Radiation Particles
Caron, P., Inguimbert, C., Artola, L., Bezerra, F., Ecoffet, R.
Published in IEEE transactions on nuclear science (01.01.2020)
Published in IEEE transactions on nuclear science (01.01.2020)
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Journal Article
Effect of the Radial Ionization Profile of Proton on SEU Sensitivity of Nanoscale SRAMs
Hubert, G., Li Cavoli, P., Federico, C., Artola, L., Busto, J.
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
Physical Mechanisms Inducing Electron Single-Event Upset
Caron, P., Inguimbert, C., Artola, L., Chatry, N., Sukhaseum, N., Ecoffet, R., Bezerra, F.
Published in IEEE transactions on nuclear science (01.08.2018)
Published in IEEE transactions on nuclear science (01.08.2018)
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Journal Article
Impact of D-Flip-Flop Architectures and Designs on Single-Event Upset Induced by Heavy Ions
Artola, L., Hubert, G., Ducret, S., Mekki, J., Al Youssef, Ahmad, Ricard, N.
Published in IEEE transactions on nuclear science (01.08.2018)
Published in IEEE transactions on nuclear science (01.08.2018)
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Journal Article
Impact of the Radial Ionization Profile on SEE Prediction for SOI Transistors and SRAMs Beyond the 32-nm Technological Node
Raine, M, Hubert, G, Gaillardin, M, Artola, L, Paillet, P, Girard, S, Sauvestre, J-E, Bournel, A
Published in IEEE transactions on nuclear science (01.06.2011)
Published in IEEE transactions on nuclear science (01.06.2011)
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Journal Article