A unified RLC model for high-speed on-chip interconnects
Sang-Pil Sim, Krishnan, S., Petranovic, D.M., Arora, N.D., Kwyro Lee, Yang, C.Y.
Published in IEEE transactions on electron devices (01.06.2003)
Published in IEEE transactions on electron devices (01.06.2003)
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Journal Article
Modeling the polysilicon depletion effect and its impact on submicrometer CMOS circuit performance
Arora, N.D., Rios, E., Cheng-Liang Huang
Published in IEEE transactions on electron devices (01.05.1995)
Published in IEEE transactions on electron devices (01.05.1995)
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Journal Article
Interconnect characterization of X architecture diagonal lines for VLSI design
Arora, N.D., Li Song, Shah, S.M., Joshi, K., Thumaty, K., Fujimura, A., Yeh, L.C., Ping Yang
Published in IEEE transactions on semiconductor manufacturing (01.05.2005)
Published in IEEE transactions on semiconductor manufacturing (01.05.2005)
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Journal Article
Conference Proceeding
PCIM: a physically based continuous short-channel IGFET model for circuit simulation
Arora, N.D., Rios, R., Cheng-Liang Huang, Raol, K.
Published in IEEE transactions on electron devices (01.06.1994)
Published in IEEE transactions on electron devices (01.06.1994)
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Journal Article
Electron and hole mobilities in silicon as a function of concentration and temperature
Arora, N.D., Hauser, J.R., Roulston, D.J.
Published in IEEE transactions on electron devices (01.02.1982)
Published in IEEE transactions on electron devices (01.02.1982)
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Journal Article
MOSFET modeling gets physical
Miura-Mattausch, M., Mattausch, H.J., Arora, N.D., Yang, C.Y.
Published in IEEE circuits and devices magazine (01.11.2001)
Published in IEEE circuits and devices magazine (01.11.2001)
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Journal Article
Test chip for inductance characterization and modeling for sub-100nm X architecture and Manhattan chip design
Arora, N.D., Li Song, Shah, S., Sinha, A., Chang, V.
Published in Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005 (2005)
Published in Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005 (2005)
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Conference Proceeding
A new technique for measuring MOSFET inversion layer mobility
Huang, C.-L., Faricelli, J.V., Arora, N.D.
Published in IEEE transactions on electron devices (01.06.1993)
Published in IEEE transactions on electron devices (01.06.1993)
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Journal Article
SPICE model and parameters for fully-depleted SOI MOSFET's including self-heating
Su, L.T., Antoniadis, D.A., Arora, N.D., Doyle, B.S., Krakauer, D.B.
Published in IEEE electron device letters (01.10.1994)
Published in IEEE electron device letters (01.10.1994)
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Journal Article
Isolation process dependence of channel mobility in thin-film SOI devices
Cheng-Liang Huang, Soleimani, H., Grula, G., Arora, N.D., Antoniadis, D.
Published in IEEE electron device letters (01.06.1996)
Published in IEEE electron device letters (01.06.1996)
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Journal Article
Circuit design guidelines for n-channel MOSFET hot carrier robustness
Mistry, K.R., Fox, T.F., Preston, R.P., Arora, N.D., Doyle, B.S., Nelsen, D.E.
Published in IEEE transactions on electron devices (01.07.1993)
Published in IEEE transactions on electron devices (01.07.1993)
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Journal Article