Direct observation of 0.57eV trap-related RF output power reduction in AlGaN/GaN high electron mobility transistors
Arehart, A.R., Sasikumar, A., Rajan, S., Via, G.D., Poling, B., Winningham, B., Heller, E.R., Brown, D., Pei, Y., Recht, F., Mishra, U.K., Ringel, S.A.
Published in Solid-state electronics (01.02.2013)
Published in Solid-state electronics (01.02.2013)
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Journal Article
Direct observation of 0.57 eV trap-related RF output power reduction in AlGaN/GaN high electron mobility transistors
Arehart, A.R., Sasikumar, A., Rajan, S., Via, G.D., Poling, B., Winningham, B., Heller, E.R., Brown, D., Pei, Y., Recht, F., Mishra, U.K., Ringel, S.A.
Published in Solid-state electronics (01.02.2013)
Published in Solid-state electronics (01.02.2013)
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Journal Article
Evidence for causality between GaN RF HEMT degradation and the EC-0.57 eV trap in GaN
Arehart, A.R., Sasikumar, A., Via, G.D., Poling, B., Heller, E.R., Ringel, S.A.
Published in Microelectronics and reliability (01.01.2016)
Published in Microelectronics and reliability (01.01.2016)
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Journal Article
Identification of an RF degradation mechanism in GaN based HEMTs triggered by midgap traps
Sasikumar, A., Arehart, A.R., Via, G.D., Winningham, B., Poling, B., Heller, E., Ringel, S.A.
Published in Microelectronics and reliability (01.11.2015)
Published in Microelectronics and reliability (01.11.2015)
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Journal Article
Evidence for causality between GaN RF HEMT degradation and the EC-0.57eV trap in GaN
Arehart, A.R., Sasikumar, A., Via, G.D., Poling, B., Heller, E.R., Ringel, S.A.
Published in Microelectronics and reliability (01.01.2016)
Published in Microelectronics and reliability (01.01.2016)
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Journal Article
Deep trap-induced dynamic on-resistance degradation in GaN-on-Si power MISHEMTs
Sasikumar, A., Arehart, A.R., Cardwell, D.W., Jackson, C.M., Sun, W., Zhang, Z., Ringel, S.A.
Published in Microelectronics and reliability (01.01.2016)
Published in Microelectronics and reliability (01.01.2016)
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Journal Article
Fast C-V method to mitigate effects of deep levels in CIGS doping profiles
Paul, P.K., Bailey, J., Zapalac, G., Arehart, A.R.
Published in 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) (01.06.2017)
Published in 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) (01.06.2017)
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Conference Proceeding
Capture Kinetics of Electron Traps in MBE-Grown n-GaN
Hierro, A., Arehart, A.R., Heying, B., Hansen, M., Speck, J.S., Mishra, U.K., DenBaars, S.P., Ringel, S.A.
Published in Physica status solidi. B. Basic research (01.11.2001)
Published in Physica status solidi. B. Basic research (01.11.2001)
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Journal Article
Conference Proceeding
Notice of Removal: In-situ and ex-situ characterizations of CIGS solar cells with KF post deposition treatment
Karki, S., Paul, P., Rajan, G., Ashrafee, T., Aryal, K., Pradhan, P., Collins, R.W., Rockett, A.A., Grassman, T.J., Ringel, S.A., Arehart, A.R., Marsillac, S.
Published in 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) (01.06.2017)
Published in 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) (01.06.2017)
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Conference Proceeding
Impact of growth pressure on defects in GaN grown by metalorganic chemical vapor deposition
Armstrong, A., Arehart, A.R., Moran, B., DenBaars, S.P., Mishra, U.K., Speck, J.S., Ringel, S.A.
Published in 2003 International Symposium on Compound Semiconductors: Post-Conference Proceedings (IEEE Cat. No.03TH8767) (2003)
Published in 2003 International Symposium on Compound Semiconductors: Post-Conference Proceedings (IEEE Cat. No.03TH8767) (2003)
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Conference Proceeding